Periódicos (Journals)

Lista de publicações em periódicos do PGMICRO [2017-2020]:

2020

Título 

Periódico

Autor Principal

3-D MONTE CARLO DEVICE SIMULATOR FOR VARIABILITY MODELING OF P-MOSFETS

JOURNAL OF COMPUTATIONAL ELECTRONICS (PRINT)

VINICIUS VALDUGA DE ALMEIDA CAMARGO

A HARDWARE ACCELERATOR FOR ONBOARD SPATIAL RESOLUTION ENHANCEMENT OF HYPERSPECTRAL IMAGES

IEEE GEOSCIENCE AND REMOTE SENSING LETTERS

ALTAMIRO AMADEU SUSIN

A NEW FEEDBACK STRATEGY TO BOOST Q-FACTOR OF CHARGE-SHARING BANDPASS FILTERS

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING

FILIPE DIAS BAUMGRATZ

A SPICE MODEL FOR DESIGN OF THRESHOLD CURRENT CONTROLLED MEMRISTIVE DEVICES BASED APPLICATIONS

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING (DORDRECHT. ONLINE)

CESAR DE SOUZA DIAS

AN ENGAGED UNIVERSITY: RESCUING SMES DURING THE COVID-19 CRISIS

RAE (ON-LINE)

DANIELA FRANCISCO BRAUNER

AN EXTENSIVE SOFT ERROR RELIABILITY ANALYSIS OF A REAL AUTONOMOUS VEHICLE SOFTWARE STACK

 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS

VITOR VIANA BANDEIRA

BINARY CORNET: ACCELERATOR FOR HR ESTIMATION FROM WRIST-PPG

IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS

LEANDRO MATEUS GIACOMINI ROCHA

CIRCUIT DESIGN USING SCHMITT TRIGGER TO RELIABILITY IMPROVEMENT

 MICROELECTRONICS AND RELIABILITY

ALEXANDRA LACKMANN ZIMPECK

COMPARING ANALYTICAL AND MONTE-CARLO-BASED SIMULATION METHODS FOR LOGIC GATES SET SENSITIVITY EVALUATION

 MICROELECTRONICS AND RELIABILITY

RAFAEL BUDIM SCHVITTZ

COMPARING THE IMPACT OF POWER SUPPLY VOLTAGE ON CMOS- AND FINFET-BASED SRAMS IN THE PRESENCE OF RESISTIVE DEFECTS

JOURNAL OF ELECTRONIC TESTING

THIAGO SANTOS COPETTI

COMPLEXITY AND COMPRESSION EFFICIENCY ASSESSMENTOF 3D-HEVC ENCODER

 MULTIMEDIA TOOLS AND APPLICATIONS

MARIO ROBERTO DE FREITAS SALDANHA

DESIGN OF AN INTEGRATED SYSTEM FOR ON-LINE TEST AND DIAGNOSIS OF ROTARY ACTUATORS

 JOURNAL OF ELECTRONIC TESTING

LEONARDO BISCH PICCOLI

DYNAMIC AND STATIC CALIBRATION OF ULTRA-LOW-VOLTAGE, DIGITAL-BASED OPERATIONAL TRANSCONDUCTANCE AMPLIFIERS

 ELECTRONICS

PEDRO FILIPE LEITE CORREIA DE TOLEDO

ENHANCING SIDE CHANNEL ATTACK-RESISTANCE OF THE STTL COMBINING MULTI-VT TRANSISTORS WITH CAPACITANCE AND CURRENT PATHS COUNTERBALANCING

JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS

RODRIGO NOGUEIRA WUERDIG

EVALUATING SOFT-CORE RISC-V PROCESSOR IN SRAM-BASED FPGA UNDER RADIATION EFFECTS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

ADRIA BARROS DE OLIVEIRA

EXPLOITING TRANSISTOR FOLDING LAYOUT AS RHBD TECHNIQUE AGAINST SINGLE-EVENT TRANSIENTS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

YGOR QUADROS DE AGUIAR

EXPLORING ABSOLUTE DIFFERENCES ARITHMETIC OPERATORS FOR POWER AND AREA-EFFICIENT SAD HARDWARE ARCHITECTURES

JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS

BRUNNO ALVES DE ABREU

FRAMEWORK-BASED ARITHMETIC DATAPATH GENERATION TO EXPLORE PARALLEL BINARY MULTIPLIERS

JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS

LEANDRO MATEUS GIACOMINI ROCHA

HIGH-THROUGHPUT HARDWARE DESIGN FOR 3D-HEVC DISPARITY ESTIMATION

IEEE DESIGN & TEST

MURILO ROSCHILDT PERLEBERG

HIGH-THROUGHPUT HARDWARE FOR 3D-HEVC DEPTH-MAP INTRA PREDICTION

IEEE DESIGN & TEST

MARIANA UCKER

HOW CASS-RS TRANSFORMED LOCAL FACE-TO-FACE SEMINARS INTO GLOBAL WEBINARS [CAS SOCIETY NEWS]

IEEE CIRCUITS AND SYSTEMS MAGAZINE (NEW YORK, N.Y. 2001: PRINT)

RICARDO AUGUSTO DA LUZ REIS

IMPACTO DE FALHAS TRANSIENTES EM MEMÓRIAS SRAM EM NANOTECNOLOGIA

REVISTA ELETRÔNICA DE INICIAÇÃO CIENTÍFICA

CLEITON MAGANO MARQUES

IMPROVING GPU REGISTER FILE RELIABILITY WITH A COMPREHENSIVE ISA EXTENSION

 MICROELECTRONICS AND RELIABILITY

MARCIO MACEDO GONCALVES

IMPROVING SELECTIVE FAULT TOLERANCE IN GPU REGISTER FILES BY RELAXING APPLICATION ACCURACY

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

MARCIO MACEDO GONCALVES

INSTABILITY OF P-I-N PEROVSKITE SOLAR CELLS UNDER REVERSE BIAS

JOURNAL OF MATERIALS CHEMISTRY A

RICARDO AUGUSTO ZANOTTO RAZERA

LOCAL VARIABILITY EVALUATION ON EFFECTIVE CHANNEL LENGTH EXTRACTED WITH SHIFT-AND-RATIO METHOD

IEEE TRANSACTIONS ON ELECTRON DEVICES

JUAN PABLO MARTINEZ BRITO

ON THE SUPERIORITY OF MODULARITY-BASED CLUSTERING FOR DETERMINING PLACEMENT-RELEVANT CLUSTERS

 INTEGRATION (AMSTERDAM. PRINT)

MATEUS PAIVA FOGACA

POWER-EFFICIENT APPROXIMATE NEWTON-RAPHSON INTEGER DIVIDER APPLIED TO NLMS ADAPTIVE FILTER FOR HIGH-QUALITY INTERFERENCE CANCELLING

CIRCUITS, SYSTEMS, AND SIGNAL PROCESSING

GUIDOTTI, VAGNER

REDUCING SOFT ERROR RATE OF SOCS ANALOG-TO-DIGITAL INTERFACES WITH DESIGN DIVERSITY REDUNDANCY

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

CARLOS JULIO GONZALEZ AGUILERA

STATISTICAL ANALYSIS OF THE IMPACT OF CHARGE TRAPS IN P-TYPE MOSFETS VIA PARTICLE-BASED MONTE CARLO DEVICE SIMULATIONS

JOURNAL OF COMPUTATIONAL ELECTRONICS (PRINT)

ALAN CARLOS JUNIOR ROSSETTO

SURVEY ON APPROXIMATE COMPUTING AND ITS INTRINSIC FAULT TOLERANCE

 ELECTRONICS

GENNARO SEVERINO RODRIGUES

THERMALLY DRIVEN HYDROGEN INTERACTION WITH SINGLE-LAYER GRAPHENE ON SIO 2</SUB> /SI SUBSTRATES QUANTIFIED BY ISOTOPIC LABELING

JOURNAL OF APPLIED PHYSICS

TAIS ORESTES FEIJO

TID EFFECTS ON I-V CHARACTERISTICS OF BULK CMOS STD AND ELT-BASED DEVICES IN 600-NM

 MICROELECTRONICS JOURNAL

PABLO ILHA VAZ

TIME-DEPENDENT RANDOM THRESHOLD VOLTAGE VARIATION DUE TO RANDOM TELEGRAPH NOISE

 IEEE TRANSACTIONS ON ELECTRON DEVICES

GILSON INACIO WIRTH

TWO TRANSISTORS VOLTAGE-MEASUREMENT-BASED TEST STRUCTURE FOR FAST MOSFET DEVICE MISMATCH CHARACTERIZATION

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

JUAN PABLO MARTINEZ BRITO

UNDERSTANDING THE IMPACT OF QUANTIZATION, ACCURACY, AND RADIATION ON THE RELIABILITY OF CONVOLUTIONAL NEURAL NETWORKS ON FPGAS

 IEEE TRANSACTIONS ON NUCLEAR SCIENCE

FABIANO PEREIRA LIBANO

 2019

A COMPACT STATISTICAL MODEL FOR THE LOW-FREQUENCY NOISE IN HALO-IMPLANTED MOSFETS: LARGE RTN INDUCED BY HALO IMPLANTS

IEEE TRANSACTIONS ON ELECTRON DEVICES

MAURICIO BANASZESKI DA SILVA

A CROSS-LAYER GATE-LEVEL-TO-APPLICATION CO-SIMULATION FOR DESIGN SPACE EXPLORATION OF APPROXIMATE CIRCUITS IN HEVC VIDEO ENCODERS

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY (PRINT)

GUILHERME PEREIRA PAIM

A FAST MONOLITHIC 8-2 ADDER COMPRESSOR CIRCUIT

JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (IMPRESSO)

LEANDRO MATEUS GIACOMINI ROCHA

A NEW NONLINEAR GLOBAL PLACEMENT FOR FPGAS: THE CHAOTIC PLACE

 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

ELIAS DE ALMEIDA RAMOS

A TECHNOLOGICALLY AGNOSTIC FRAMEWORK FOR CYBER-PHYSICAL AND IOT PROCESSING-IN-MEMORY-BASED SYSTEMS SIMULATION

 MICROPROCESSORS AND MICROSYSTEMS

PAULO CESAR SANTOS DA SILVA JUNIOR

A 0.3-1.2V SCHOTTKY-BASED CMOS ZTC VOLTAGE REFERENCE

 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS

PEDRO FILIPE LEITE CORREIA DE TOLEDO

AN OPTIMIZED COST FLOW ALGORITHM TO SPREAD CELLS IN DETAILED PLACEMENT

ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS

JUCEMAR LUIS MONTEIRO

ANNEALING RESPONSE OF MONOLAYER MOS <SUB>2</SUB>  GROWN BY CHEMICAL VAPOR DEPOSITION

 ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY

EDUARDO PITTHAN FILHO

APPROXIMATE TMR BASED ON SUCCESSIVE APPROXIMATION AND LOOP PERFORATION IN MICROPROCESSORS

 MICROELECTRONICS AND RELIABILITY

GENNARO SEVERINO RODRIGUES

ASSESSING THE RELIABILITY OF SUCCESSIVE APPROXIMATE COMPUTING ALGORITHMS UNDER FAULT INJECTION

JOURNAL OF ELECTRONIC TESTING

GENNARO SEVERINO RODRIGUES

BUILDING ATMR CIRCUITS USING APPROXIMATE LIBRARY AND HEURISTIC APPROACHES

 MICROELECTRONICS AND RELIABILITY

IURI ALBANDES CUNHA GOMES

CHEMICAL DOPING AND ETCHING OF GRAPHENE: TUNING THE EFFECTS OF NO ANNEALING

JOURNAL OF PHYSICAL CHEMISTRY. C

GUILHERME KOSZENIEWSKI ROLIM

CHEMICAL STATE OF PHOSPHOROUS AT THE SIC/SIO2 INTERFACE

THIN SOLID FILMS

EDUARDO PITTHAN FILHO

COMBINING GEO <SUB>2</SUB> PASSIVATION STRATEGIES AIMING AT DIELECTRIC LAYERS WITH SUPERIOR PROPERTIES ON GERMANIUM SUBSTRATES

JOURNAL OF MATERIALS CHEMISTRY C

LOUISE PATRON ETCHEVERRY

DESIGN METHODOLOGY TO EXPLORE HYBRID APPROXIMATE ADDERS FOR ENERGY-EFFICIENT IMAGE AND VIDEO PROCESSING ACCELERATORS

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

LEONARDO BANDEIRA SOARES

DYNAMIC HEAVY IONS SEE TESTING OF NANOXPLORE RADIATION HARDENED SRAM-BASED FPGA: RELIABILITY-PERFORMANCE ANALYSIS

 MICROELECTRONICS AND RELIABILITY

ADRIA BARROS DE OLIVEIRA

ENERGY-AWARE MOTION AND DISPARITY ESTIMATION SYSTEM FOR 3D-HEVC WITH RUN-TIME ADAPTIVE MEMORY HIERARCHY

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY (PRINT)

VLADIMIR AFONSO

EVALUATING THE IMPACT OF TEMPERATURE ON DYNAMIC FAULT BEHAVIOUR OF FINFET-BASED SRAMS WITH RESISTIVE DEFECTS

JOURNAL OF ELECTRONIC TESTING

GUILHERME CARDOSO MEDEIROS

EXACT BENCHMARK CIRCUITS FOR LOGIC SYNTHESIS

IEEE DESIGN & TEST

WALTER LAU NETO

EXPLOITING MEMORY ALLOCATIONS IN CLUSTERIZED MANY-CORE ARCHITECTURES

 IET COMPUTERS & DIGITAL TECHNIQUES (PRINT)

RAFAEL FRAGA GARIBOTTI

EXPLORING THE LIMITATIONS OF DATAFLOW SIHFT TECHNIQUES IN OUT-OF-ORDER SUPERSCALAR PROCESSORS

 MICROELECTRONICS AND RELIABILITY

DOUGLAS MACIEL CARDOSO

FOUR-LEVEL FORMS FOR MEMRISTIVE MATERIAL IMPLICATION LOGIC

 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS (PRINT)

FELIPE DOS SANTOS MARRANGHELLO

GATE MAPPING IMPACT ON VARIABILITY ROBUSTNESS IN FINFET TECHNOLOGY

 MICROELECTRONICS AND RELIABILITY

LEONARDO HEITICH BRENDLER

MAJ-N LOGIC SYNTHESIS FOR EMERGING TECHNOLOGY

 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

AUGUSTO NEUTZLING SILVA

MULTI-LEVEL DESIGN INFLUENCES ON ROBUSTNESS EVALUATION OF 7NM FINFET TECHNOLOGY

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

LEONARDO HEITICH BRENDLER

P4VBOX: ENABLING P4-BASED SWITCH VIRTUALIZATION

IEEE COMMUNICATIONS LETTERS (PRINT)

MATEUS SAQUETTI PEREIRA DE CARVALHO TIRONE

RELIABILITY CALCULATION WITH RESPECT TO FUNCTIONAL FAILURES INDUCED BY RADIATION IN TMR ARM CORTEX-M0 SOFT-CORE EMBEDDED INTO SRAM-BASED FPGA

 IEEE TRANSACTIONS ON NUCLEAR SCIENCE

LUIS ALBERTO CONTRERAS BENITES

SELECTIVE FAULT TOLERANCE FOR REGISTER FILES OF GRAPHICS PROCESSING UNITS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

MARCIO MACEDO GONCALVES

SELECTIVE HARDENING FOR NEURAL NETWORKS IN FPGAS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

FABIANO PEREIRA LIBANO

SEMIOTIC ASPECTS IN PATENT INTERPRETATION

 INTERNATIONAL JOURNAL FOR THE SEMIOTICS OF LAW

SIMONE ROSA NUNES REIS

SPECTRALLY EXTENDED, NEAR-SURFACE REFRACTIVE INDEX DETERMINATION: ATOMIC LAYER DEPOSITED TIO <SUB>2</SUB> ON SI

OPTICS LETTERS

MARCELO BARBALHO PEREIRA

TUNING MOS2 REACTIVITY TOWARD HALOGENATION

 JOURNAL OF MATERIALS CHEMISTRY C

GABRIELA COPETTI

USING MACHINE LEARNING TECHNIQUES TO EVALUATE MULTICORE SOFT ERROR RELIABILITY

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

FELIPE ROCHA DA ROSA

 2018

Título

Título Periódico

Autor Principal

A FAST AND ACCURATE HYBRID FAULT INJECTION PLATFORM FOR TRANSIENT AND PERMANENT FAULTS

 DESIGN AUTOMATION FOR EMBEDDED SYSTEMS

ANDERSON LUIZ SARTOR

A NOVEL RESECTION-INTERSECTION ALGORITHM WITH FAST TRIANGULATION APPLIED TO MONOCULAR VISUAL ODOMETRY

 IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS (PRINT)

FABIO IRIGON PEREIRA

A 0.12-0.4 V, VERSATILE 3-TRANSISTOR CMOS VOLTAGE REFERENCE FOR ULTRA-LOW POWER SYSTEMS

 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

ARTHUR CAMPOS DE OLIVEIRA

ANALYSIS OF 6-T SRAM CELL IN SUB-45-NM CMOS AND FINFET TECHNOLOGIES

 MICROELECTRONICS AND RELIABILITY

ROBERTO BORBA DE ALMEIDA

ANOMALOUS CURRENT-VOLTAGE BEHAVIOR IN AL/TIO /N-SI STRUCTURES

PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS (PRINT)

RICARDO AUGUSTO ZANOTTO RAZERA

BRAM-BASED FUNCTION REUSE FOR MULTI-CORE ARCHITECTURES IN FPGAS

 MICROPROCESSORS AND MICROSYSTEMS

PEDRO HENRIQUE EXENBERGER BECKER

CHARACTERIZATION OF A SIC MIS SCHOTTKY DIODE AS RBS PARTICLE DETECTOR

 JOURNAL OF INSTRUMENTATION

IVAN RODRIGO KAUFMANN

CHEMICAL AND MORPHOLOGICAL MODIFICATIONS OF SINGLE LAYER GRAPHENE SUBMITTED TO ANNEALING IN WATER VAPOR

 APPLIED SURFACE SCIENCE

GUILHERME KOSZENIEWSKI ROLIM

DESIGN FLOW METHODOLOGY FOR RADIATION HARDENED BY DESIGN CMOS ENCLOSED-LAYOUT-TRANSISTOR-BASED STANDARD-CELL LIBRARY

 JOURNAL OF ELECTRONIC TESTING

PABLO ILHA VAZ

DESIGN OF APPROXIMATE-TMR USING APPROXIMATE LIBRARY AND HEURISTIC APPROACHES

 MICROELECTRONICS AND RELIABILITY

IURI ALBANDES CUNHA GOMES

EFFECTIVE LOGIC SYNTHESIS FOR THRESHOLD LOGIC CIRCUIT DESIGN

 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

AUGUSTO NEUTZLING SILVA

EFFICIENTLY MAPPING VLSI CIRCUITS WITH SIMPLE CELLS

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

JODY MAICK ARAUJO DE MATOS

ENERGY AND RATE-AWARE DESIGN FOR HEVC MOTION ESTIMATION BASED ON PARETO EFFICIENCY

 JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (IMPRESSO)

BRUNO ZATT

ENERGY-DELAY-FIT PRODUCT TO COMPARE PROCESSORS AND ALGORITHM IMPLEMENTATIONS

 MICROELECTRONICS AND RELIABILITY

VINICIUS FRATIN NETTO

EVALUATING THE RELIABILITY OF A GPU PIPELINE TO SEU AND THE IMPACTS OF SOFTWARE-BASED AND HARDWARE-BASED FAULT TOLERANCE TECHNIQUES

 MICROELECTRONICS AND RELIABILITY

MARCIO MACEDO GONCALVES

EVALUATION OF VARIABILITY USING SCHMITT TRIGGER ON FULL ADDERS LAYOUT

 MICROELECTRONICS AND RELIABILITY

LEONARDO BARLETTE DE MORAES

GROWTH OF BORON-DOPED FEW-LAYER GRAPHENE BY MOLECULAR BEAM EPITAXY

APPLIED PHYSICS LETTERS

GABRIEL VIEIRA SOARES

IMPACT OF DIFFERENT TRANSISTOR ARRANGEMENTS ON GATE VARIABILITY

 MICROELECTRONICS AND RELIABILITY

ALEXANDRA LACKMANN ZIMPECK

IMPROVING NETWORK RESOURCES ALLOCATION IN SMART CITIES VIDEO SURVEILLANCE

 COMPUTER NETWORKS

RAFAEL KUNST

KERNEL AND LAYER VULNERABILITY FACTOR TO EVALUATE OBJECT DETECTION RELIABILITY IN GPUS

 IET COMPUTERS & DIGITAL TECHNIQUES (PRINT)

FERNANDO FERNANDES DOS SANTOS

LOCKSTEP DUAL-CORE ARM A9: IMPLEMENTATION AND RESILIENCE ANALYSIS UNDER HEAVY ION INDUCED SOFT ERRORS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

ADRIA BARROS DE OLIVEIRA

ON THE EFFICACY OF ECC AND THE BENEFITS OF FINFET TRANSISTOR LAYOUT FOR GPU RELIABILITY

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

CAIO BRIGAGAO LUNARDI

OPTIMIZED SOLUTION TO ACCELERATE IN HARDWARE AN INTRA H.264/SVC VIDEO ENCODER

 IEEE MICRO

RONALDO HUSEMANN

PHOTOLUMINESCENCE PROPERTIES OF ARSENIC AND BORON DOPED SI N NANOCRYSTAL EMBEDDED IN SIN O MATRIX

 MATERIALS RESEARCH EXPRESS

DENISE PUGLIA

RELIABILITY-PERFORMANCE ANALYSIS OF HARDWARE AND SOFTWARE CO-DESIGNS IN SRAM-BASED APSOCS

 IEEE TRANSACTIONS ON NUCLEAR SCIENCE

LUCAS ANTUNES TAMBARA

REVERSIBILITY OF GRAPHENE PHOTOCHLORINATION

JOURNAL OF PHYSICAL CHEMISTRY. C

GABRIELA COPETTI

TID EFFECTS ON A DATA ACQUISITION SYSTEM WITH DESIGN DIVERSITY REDUNDANCY

 IEEE TRANSACTIONS ON NUCLEAR SCIENCE

CARLOS JULIO GONZALEZ AGUILERA

40-NM CMOS WIDEBAND HIGH-IF RECEIVER USING A MODIFIED CHARGE-SHARING BANDPASS FILTER TO BOOST Q-FACTOR

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

FILIPE DIAS BAUMGRATZ

  2017

Título

Título Periódico

Autor Principal

A COMPACT MODEL FOR THE STATISTICS OF THE LOW-FREQUENCY NOISE OF MOSFETS WITH LATERALLY UNIFORM DOPING

 IEEE TRANSACTIONS ON ELECTRON DEVICES

MAURICIO BANASZESKI DA SILVA

A HIGH-PSR EMI-RESISTANT NMOS-ONLY VOLTAGE REFERENCE USING ZERO- $V_T$ ACTIVE LOADS

 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY (PRINT)

DAVID JAVIER CORDOVA VIVAS

A LOW-LEVEL SOFTWARE-BASED FAULT TOLERANCE APPROACH TO DETECT SEUS IN GPUS' REGISTER FILES

 MICROELECTRONICS AND RELIABILITY

MARCIO MACEDO GONCALVES

A SIMPLE AND EFFECTIVE HEURISTIC METHOD FOR THRESHOLD LOGIC IDENTIFICATION

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

AUGUSTO NEUTZLING SILVA

A 0.4-3.3 GHZ LOW-NOISE VARIABLE GAIN AMPLIFIER WITH 35 DB TUNING RANGE, 4.9 DB NF, AND 40 DBM IIP2

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING

FILIPE DIAS BAUMGRATZ

ANALYZING RELIABILITY AND PERFORMANCE TRADE-OFFS OF HLS-BASED DESIGNS IN SRAM-BASED FPGAS UNDER SOFT ERRORS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

LUCAS ANTUNES TAMBARA

ANALYZING THE IMPACT OF FAULT TOLERANCE METHODS IN ARM PROCESSORS UNDER SOFT ERRORS RUNNING LINUX AND PARALLELIZATION APIS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

GENNARO SEVERINO RODRIGUES

ANALYZING THE IMPACT OF RADIATION-INDUCED FAILURES IN FLASH-BASED APSOC WITH AND WITHOUT FAULT TOLERANCE TECHNIQUES AT CERN ENVIRONMENT

 MICROELECTRONICS AND RELIABILITY

LUCAS ANTUNES TAMBARA

ANALYZING THE INFLUENCE OF THE ANGLES OF INCIDENCE AND ROTATION ON MBU EVENTS INDUCED BY LOW LET HEAVY IONS IN A 28-NM SRAM-BASED FPGA

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

JORGE LUCIO TONFAT SECLEN

AUTOCORRELATION ANALYSIS AS A TECHNIQUE TO STUDY PHYSICAL MECHANISMS OF MOSFET LOW-FREQUENCY NOISE

IEEE TRANSACTIONS ON ELECTRON DEVICES

THIAGO HANNA BOTH

BROADENING MOLECULAR WEIGHT POLYETHYLENE DISTRIBUTION BY TAILORING THE SILICA SURFACE ENVIRONMENT ON SUPPORTED METALLOCENES

 APPLIED SURFACE SCIENCE

ELIANA CRISTINA GALLAND BARRERA

CHEMICAL AND MORPHOLOGICAL MODIFICATIONS OF SINGLE LAYER GRAPHENE SUBMITTED TO ANNEALING IN WATER VAPOR

 APPLIED SURFACE SCIENCE

GUILHERME KOSZENIEWSKI ROLIM

DETERMINISTIC METHODOLOGY FOR ELECTRICAL SIMULATION OF BTI INDUCED PULSE BROADENING

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

GABRIELA FIRPO FURTADO

ELECTRON IRRADIATION EFFECTS ON THE NUCLEATION AND GROWTH OF AU NANOPARTICLES IN SILICON NITRIDE MEMBRANES

JOURNAL OF APPLIED PHYSICS

MARIANA DE MELLO TIMM

ENERGY-AWARE CACHE HIERARCHY ASSESSMENT TARGETING HEVC ENCODER EXECUTION

JOURNAL OF REAL-TIME IMAGE PROCESSING (PRINT)

EDUARDA RODRIGUES MONTEIRO

EVALUATION OF HEAVY-ION IMPACT IN BULK AND FDSOI DEVICES UNDER ZTC CONDITION

 MICROELECTRONICS AND RELIABILITY

WALTER ENRIQUE CALIENES BARTRA

EVALUATION OF RADIATION-INDUCED SOFT ERROR IN MAJORITY VOTERS DESIGNED IN 7 NM FINFET TECHNOLOGY

 MICROELECTRONICS AND RELIABILITY

YGOR QUADROS DE AGUIAR

EXPLOITING IDLE HARDWARE TO PROVIDE LOW OVERHEAD FAULT TOLERANCE FOR VLIW PROCESSORS

 ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS

ANDERSON LUIZ SARTOR

INVERTER CIRCUITS ON FREESTANDING FLEXIBLE SUBSTRATE USING ZNO NANOPARTICLES FOR COST-EFFICIENT ELECTRONICS

SOLID-STATE ELECTRONICS

FABIO FEDRIZZI VIDOR

MODELING AND SIMULATION OF THE CHARGE TRAPPING COMPONENT OF BTI AND RTS

 MICROELECTRONICS AND RELIABILITY

THIAGO HANNA BOTH

MODELS OF COMPUTATION FOR NOC MAPPING: TIMING AND ENERGY SAVING AWARENESS

 MICROELECTRONICS JOURNAL

CESAR AUGUSTO MISSIO MARCON

ON THE RELIABILITY OF LINEAR REGRESSION AND PATTERN RECOGNITION FEED-FORWARD ARTIFICIAL NEURAL NETWORKS IN FPGAS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

FABIANO PEREIRA LIBANO

PERFORMANCE AND SIMULATION ACCURACY EVALUATION OF ANALOG CIRCUITS WITH ENCLOSED LAYOUT TRANSISTORS

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING

GUILHERME SCHWANKE CARDOSO

PICOWATT, 0.45-0.6 V SELF-BIASED SUBTHRESHOLD CMOS VOLTAGE REFERENCE

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

ARTHUR CAMPOS DE OLIVEIRA

POWER-EFFICIENT SUM OF ABSOLUTE DIFFERENCES HARDWARE ARCHITECTURE USING ADDER COMPRESSORS FOR INTEGER MOTION ESTIMATION DESIGN

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT)

BIANCA SANTOS DA CUNHA DA SILVEIRA

REGISTER FILE CRITICALITY AND COMPILER OPTIMIZATION EFFECTS ON EMBEDDED MICROPROCESSORS RELIABILITY

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

FILIPE MACIEL LINS

SAT-BASED FORMULATION FOR LOGICAL CAPACITY EVALUATION OF VIA-CONFIGURABLE STRUCTURED ASIC

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING

VINICIUS DAL BEM

SINGLE EVENT TRANSIENT EFFECTS ON CHARGE REDISTRIBUTION SAR ADCS

 MICROELECTRONICS AND RELIABILITY

THALES EXENBERGER BECKER

SOFT ERROR SUSCEPTIBILITY ANALYSIS METHODOLOGY OF HLS DESIGNS IN SRAM-BASED FPGAS

 MICROPROCESSORS AND MICROSYSTEMS

JORGE LUCIO TONFAT SECLEN

SYSTEM DESIGN OF A 2.75-MW DISCRETE-TIME SUPERHETERODYNE RECEIVER FOR BLUETOOTH LOW ENERGY

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

SANDRO BINSFELD FERREIRA

TIMING ATTACK ON NOC-BASED SYSTEMS: PRIME+PROBE ATTACK AND NOC-BASED PROTECTION

 MICROPROCESSORS AND MICROSYSTEMS

CEZAR RODOLFO WEDIG REINBRECHT

TOTAL DOSE EFFECTS ON VOLTAGE REFERENCES IN 130 NM CMOS TECHNOLOGY

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

DALTON MARTINI COLOMBO

UMA ABORDAGEM DE TOLERÂNCIA A FALHAS BASEADA EM SOFTWARE DE BAIXO NÍVEL PARA DETECTAR SEUS EM BANCOS DE REGISTRADORES DE GPUS

REVISTA JUNIOR DE INICIAÇÃO CIENTÍFICA EM CIÊNCIAS EXATAS E ENGENHARIA

MARCIO MACEDO GONCALVES

UNRAVELING THE MECHANISMS RESPONSIBLE FOR THE INTERFACIAL REGION FORMATION IN 4H-SIC DRY THERMAL OXIDATION

JOURNAL OF APPLIED PHYSICS

GUSTAVO HENRIQUE STEDILE DARTORA

4H-SIC SURFACE ENERGY TUNING BY NITROGEN UP-TAKE

APPLIED SURFACE SCIENCE

EDUARDO PITTHAN FILHO

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