Periódicos (Journals)
2020
|
Título |
Periódico |
Autor Principal |
|
3-D MONTE CARLO DEVICE SIMULATOR FOR VARIABILITY MODELING OF P-MOSFETS |
JOURNAL OF COMPUTATIONAL ELECTRONICS (PRINT) |
VINICIUS VALDUGA DE ALMEIDA CAMARGO |
|
A HARDWARE ACCELERATOR FOR ONBOARD SPATIAL RESOLUTION ENHANCEMENT OF HYPERSPECTRAL IMAGES |
IEEE GEOSCIENCE AND REMOTE SENSING LETTERS |
ALTAMIRO AMADEU SUSIN |
|
A NEW FEEDBACK STRATEGY TO BOOST Q-FACTOR OF CHARGE-SHARING BANDPASS FILTERS |
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING |
FILIPE DIAS BAUMGRATZ |
|
A SPICE MODEL FOR DESIGN OF THRESHOLD CURRENT CONTROLLED MEMRISTIVE DEVICES BASED APPLICATIONS |
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING (DORDRECHT. ONLINE) |
CESAR DE SOUZA DIAS |
|
AN ENGAGED UNIVERSITY: RESCUING SMES DURING THE COVID-19 CRISIS |
RAE (ON-LINE) |
DANIELA FRANCISCO BRAUNER |
|
AN EXTENSIVE SOFT ERROR RELIABILITY ANALYSIS OF A REAL AUTONOMOUS VEHICLE SOFTWARE STACK |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS |
VITOR VIANA BANDEIRA |
|
BINARY CORNET: ACCELERATOR FOR HR ESTIMATION FROM WRIST-PPG |
IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS |
LEANDRO MATEUS GIACOMINI ROCHA |
|
CIRCUIT DESIGN USING SCHMITT TRIGGER TO RELIABILITY IMPROVEMENT |
MICROELECTRONICS AND RELIABILITY |
ALEXANDRA LACKMANN ZIMPECK |
|
COMPARING ANALYTICAL AND MONTE-CARLO-BASED SIMULATION METHODS FOR LOGIC GATES SET SENSITIVITY EVALUATION |
MICROELECTRONICS AND RELIABILITY |
RAFAEL BUDIM SCHVITTZ |
|
COMPARING THE IMPACT OF POWER SUPPLY VOLTAGE ON CMOS- AND FINFET-BASED SRAMS IN THE PRESENCE OF RESISTIVE DEFECTS |
JOURNAL OF ELECTRONIC TESTING |
THIAGO SANTOS COPETTI |
|
COMPLEXITY AND COMPRESSION EFFICIENCY ASSESSMENTOF 3D-HEVC ENCODER |
MULTIMEDIA TOOLS AND APPLICATIONS |
MARIO ROBERTO DE FREITAS SALDANHA |
|
DESIGN OF AN INTEGRATED SYSTEM FOR ON-LINE TEST AND DIAGNOSIS OF ROTARY ACTUATORS |
JOURNAL OF ELECTRONIC TESTING |
LEONARDO BISCH PICCOLI |
|
DYNAMIC AND STATIC CALIBRATION OF ULTRA-LOW-VOLTAGE, DIGITAL-BASED OPERATIONAL TRANSCONDUCTANCE AMPLIFIERS |
ELECTRONICS |
PEDRO FILIPE LEITE CORREIA DE TOLEDO |
|
ENHANCING SIDE CHANNEL ATTACK-RESISTANCE OF THE STTL COMBINING MULTI-VT TRANSISTORS WITH CAPACITANCE AND CURRENT PATHS COUNTERBALANCING |
JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS |
RODRIGO NOGUEIRA WUERDIG |
|
EVALUATING SOFT-CORE RISC-V PROCESSOR IN SRAM-BASED FPGA UNDER RADIATION EFFECTS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
ADRIA BARROS DE OLIVEIRA |
|
EXPLOITING TRANSISTOR FOLDING LAYOUT AS RHBD TECHNIQUE AGAINST SINGLE-EVENT TRANSIENTS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
YGOR QUADROS DE AGUIAR |
|
EXPLORING ABSOLUTE DIFFERENCES ARITHMETIC OPERATORS FOR POWER AND AREA-EFFICIENT SAD HARDWARE ARCHITECTURES |
JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS |
BRUNNO ALVES DE ABREU |
|
FRAMEWORK-BASED ARITHMETIC DATAPATH GENERATION TO EXPLORE PARALLEL BINARY MULTIPLIERS |
JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS |
LEANDRO MATEUS GIACOMINI ROCHA |
|
HIGH-THROUGHPUT HARDWARE DESIGN FOR 3D-HEVC DISPARITY ESTIMATION |
IEEE DESIGN & TEST |
MURILO ROSCHILDT PERLEBERG |
|
HIGH-THROUGHPUT HARDWARE FOR 3D-HEVC DEPTH-MAP INTRA PREDICTION |
IEEE DESIGN & TEST |
MARIANA UCKER |
|
HOW CASS-RS TRANSFORMED LOCAL FACE-TO-FACE SEMINARS INTO GLOBAL WEBINARS [CAS SOCIETY NEWS] |
IEEE CIRCUITS AND SYSTEMS MAGAZINE (NEW YORK, N.Y. 2001: PRINT) |
RICARDO AUGUSTO DA LUZ REIS |
|
IMPACTO DE FALHAS TRANSIENTES EM MEMÓRIAS SRAM EM NANOTECNOLOGIA |
REVISTA ELETRÔNICA DE INICIAÇÃO CIENTÍFICA |
CLEITON MAGANO MARQUES |
|
IMPROVING GPU REGISTER FILE RELIABILITY WITH A COMPREHENSIVE ISA EXTENSION |
MICROELECTRONICS AND RELIABILITY |
MARCIO MACEDO GONCALVES |
|
IMPROVING SELECTIVE FAULT TOLERANCE IN GPU REGISTER FILES BY RELAXING APPLICATION ACCURACY |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
MARCIO MACEDO GONCALVES |
|
INSTABILITY OF P-I-N PEROVSKITE SOLAR CELLS UNDER REVERSE BIAS |
JOURNAL OF MATERIALS CHEMISTRY A |
RICARDO AUGUSTO ZANOTTO RAZERA |
|
LOCAL VARIABILITY EVALUATION ON EFFECTIVE CHANNEL LENGTH EXTRACTED WITH SHIFT-AND-RATIO METHOD |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
JUAN PABLO MARTINEZ BRITO |
|
ON THE SUPERIORITY OF MODULARITY-BASED CLUSTERING FOR DETERMINING PLACEMENT-RELEVANT CLUSTERS |
INTEGRATION (AMSTERDAM. PRINT) |
MATEUS PAIVA FOGACA |
|
POWER-EFFICIENT APPROXIMATE NEWTON-RAPHSON INTEGER DIVIDER APPLIED TO NLMS ADAPTIVE FILTER FOR HIGH-QUALITY INTERFERENCE CANCELLING |
CIRCUITS, SYSTEMS, AND SIGNAL PROCESSING |
GUIDOTTI, VAGNER |
|
REDUCING SOFT ERROR RATE OF SOCS ANALOG-TO-DIGITAL INTERFACES WITH DESIGN DIVERSITY REDUNDANCY |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
CARLOS JULIO GONZALEZ AGUILERA |
|
STATISTICAL ANALYSIS OF THE IMPACT OF CHARGE TRAPS IN P-TYPE MOSFETS VIA PARTICLE-BASED MONTE CARLO DEVICE SIMULATIONS |
JOURNAL OF COMPUTATIONAL ELECTRONICS (PRINT) |
ALAN CARLOS JUNIOR ROSSETTO |
|
SURVEY ON APPROXIMATE COMPUTING AND ITS INTRINSIC FAULT TOLERANCE |
ELECTRONICS |
GENNARO SEVERINO RODRIGUES |
|
THERMALLY DRIVEN HYDROGEN INTERACTION WITH SINGLE-LAYER GRAPHENE ON SIO 2</SUB> /SI SUBSTRATES QUANTIFIED BY ISOTOPIC LABELING |
JOURNAL OF APPLIED PHYSICS |
TAIS ORESTES FEIJO |
|
TID EFFECTS ON I-V CHARACTERISTICS OF BULK CMOS STD AND ELT-BASED DEVICES IN 600-NM |
MICROELECTRONICS JOURNAL |
PABLO ILHA VAZ |
|
TIME-DEPENDENT RANDOM THRESHOLD VOLTAGE VARIATION DUE TO RANDOM TELEGRAPH NOISE |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
GILSON INACIO WIRTH |
|
TWO TRANSISTORS VOLTAGE-MEASUREMENT-BASED TEST STRUCTURE FOR FAST MOSFET DEVICE MISMATCH CHARACTERIZATION |
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING |
JUAN PABLO MARTINEZ BRITO |
|
UNDERSTANDING THE IMPACT OF QUANTIZATION, ACCURACY, AND RADIATION ON THE RELIABILITY OF CONVOLUTIONAL NEURAL NETWORKS ON FPGAS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
FABIANO PEREIRA LIBANO |
2019
|
A COMPACT STATISTICAL MODEL FOR THE LOW-FREQUENCY NOISE IN HALO-IMPLANTED MOSFETS: LARGE RTN INDUCED BY HALO IMPLANTS |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
MAURICIO BANASZESKI DA SILVA |
|
A CROSS-LAYER GATE-LEVEL-TO-APPLICATION CO-SIMULATION FOR DESIGN SPACE EXPLORATION OF APPROXIMATE CIRCUITS IN HEVC VIDEO ENCODERS |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY (PRINT) |
GUILHERME PEREIRA PAIM |
|
A FAST MONOLITHIC 8-2 ADDER COMPRESSOR CIRCUIT |
JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (IMPRESSO) |
LEANDRO MATEUS GIACOMINI ROCHA |
|
A NEW NONLINEAR GLOBAL PLACEMENT FOR FPGAS: THE CHAOTIC PLACE |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
ELIAS DE ALMEIDA RAMOS |
|
A TECHNOLOGICALLY AGNOSTIC FRAMEWORK FOR CYBER-PHYSICAL AND IOT PROCESSING-IN-MEMORY-BASED SYSTEMS SIMULATION |
MICROPROCESSORS AND MICROSYSTEMS |
PAULO CESAR SANTOS DA SILVA JUNIOR |
|
A 0.3-1.2V SCHOTTKY-BASED CMOS ZTC VOLTAGE REFERENCE |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS |
PEDRO FILIPE LEITE CORREIA DE TOLEDO |
|
AN OPTIMIZED COST FLOW ALGORITHM TO SPREAD CELLS IN DETAILED PLACEMENT |
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS |
JUCEMAR LUIS MONTEIRO |
|
ANNEALING RESPONSE OF MONOLAYER MOS <SUB>2</SUB> GROWN BY CHEMICAL VAPOR DEPOSITION |
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY |
EDUARDO PITTHAN FILHO |
|
APPROXIMATE TMR BASED ON SUCCESSIVE APPROXIMATION AND LOOP PERFORATION IN MICROPROCESSORS |
MICROELECTRONICS AND RELIABILITY |
GENNARO SEVERINO RODRIGUES |
|
ASSESSING THE RELIABILITY OF SUCCESSIVE APPROXIMATE COMPUTING ALGORITHMS UNDER FAULT INJECTION |
JOURNAL OF ELECTRONIC TESTING |
GENNARO SEVERINO RODRIGUES |
|
BUILDING ATMR CIRCUITS USING APPROXIMATE LIBRARY AND HEURISTIC APPROACHES |
MICROELECTRONICS AND RELIABILITY |
IURI ALBANDES CUNHA GOMES |
|
CHEMICAL DOPING AND ETCHING OF GRAPHENE: TUNING THE EFFECTS OF NO ANNEALING |
JOURNAL OF PHYSICAL CHEMISTRY. C |
GUILHERME KOSZENIEWSKI ROLIM |
|
CHEMICAL STATE OF PHOSPHOROUS AT THE SIC/SIO2 INTERFACE |
THIN SOLID FILMS |
EDUARDO PITTHAN FILHO |
|
COMBINING GEO <SUB>2</SUB> PASSIVATION STRATEGIES AIMING AT DIELECTRIC LAYERS WITH SUPERIOR PROPERTIES ON GERMANIUM SUBSTRATES |
JOURNAL OF MATERIALS CHEMISTRY C |
LOUISE PATRON ETCHEVERRY |
|
DESIGN METHODOLOGY TO EXPLORE HYBRID APPROXIMATE ADDERS FOR ENERGY-EFFICIENT IMAGE AND VIDEO PROCESSING ACCELERATORS |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
LEONARDO BANDEIRA SOARES |
|
DYNAMIC HEAVY IONS SEE TESTING OF NANOXPLORE RADIATION HARDENED SRAM-BASED FPGA: RELIABILITY-PERFORMANCE ANALYSIS |
MICROELECTRONICS AND RELIABILITY |
ADRIA BARROS DE OLIVEIRA |
|
ENERGY-AWARE MOTION AND DISPARITY ESTIMATION SYSTEM FOR 3D-HEVC WITH RUN-TIME ADAPTIVE MEMORY HIERARCHY |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY (PRINT) |
VLADIMIR AFONSO |
|
EVALUATING THE IMPACT OF TEMPERATURE ON DYNAMIC FAULT BEHAVIOUR OF FINFET-BASED SRAMS WITH RESISTIVE DEFECTS |
JOURNAL OF ELECTRONIC TESTING |
GUILHERME CARDOSO MEDEIROS |
|
EXACT BENCHMARK CIRCUITS FOR LOGIC SYNTHESIS |
IEEE DESIGN & TEST |
WALTER LAU NETO |
|
EXPLOITING MEMORY ALLOCATIONS IN CLUSTERIZED MANY-CORE ARCHITECTURES |
IET COMPUTERS & DIGITAL TECHNIQUES (PRINT) |
RAFAEL FRAGA GARIBOTTI |
|
EXPLORING THE LIMITATIONS OF DATAFLOW SIHFT TECHNIQUES IN OUT-OF-ORDER SUPERSCALAR PROCESSORS |
MICROELECTRONICS AND RELIABILITY |
DOUGLAS MACIEL CARDOSO |
|
FOUR-LEVEL FORMS FOR MEMRISTIVE MATERIAL IMPLICATION LOGIC |
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS (PRINT) |
FELIPE DOS SANTOS MARRANGHELLO |
|
GATE MAPPING IMPACT ON VARIABILITY ROBUSTNESS IN FINFET TECHNOLOGY |
MICROELECTRONICS AND RELIABILITY |
LEONARDO HEITICH BRENDLER |
|
MAJ-N LOGIC SYNTHESIS FOR EMERGING TECHNOLOGY |
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS |
AUGUSTO NEUTZLING SILVA |
|
MULTI-LEVEL DESIGN INFLUENCES ON ROBUSTNESS EVALUATION OF 7NM FINFET TECHNOLOGY |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
LEONARDO HEITICH BRENDLER |
|
P4VBOX: ENABLING P4-BASED SWITCH VIRTUALIZATION |
IEEE COMMUNICATIONS LETTERS (PRINT) |
MATEUS SAQUETTI PEREIRA DE CARVALHO TIRONE |
|
RELIABILITY CALCULATION WITH RESPECT TO FUNCTIONAL FAILURES INDUCED BY RADIATION IN TMR ARM CORTEX-M0 SOFT-CORE EMBEDDED INTO SRAM-BASED FPGA |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
LUIS ALBERTO CONTRERAS BENITES |
|
SELECTIVE FAULT TOLERANCE FOR REGISTER FILES OF GRAPHICS PROCESSING UNITS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
MARCIO MACEDO GONCALVES |
|
SELECTIVE HARDENING FOR NEURAL NETWORKS IN FPGAS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
FABIANO PEREIRA LIBANO |
|
SEMIOTIC ASPECTS IN PATENT INTERPRETATION |
INTERNATIONAL JOURNAL FOR THE SEMIOTICS OF LAW |
SIMONE ROSA NUNES REIS |
|
SPECTRALLY EXTENDED, NEAR-SURFACE REFRACTIVE INDEX DETERMINATION: ATOMIC LAYER DEPOSITED TIO <SUB>2</SUB> ON SI |
OPTICS LETTERS |
MARCELO BARBALHO PEREIRA |
|
TUNING MOS2 REACTIVITY TOWARD HALOGENATION |
JOURNAL OF MATERIALS CHEMISTRY C |
GABRIELA COPETTI |
|
USING MACHINE LEARNING TECHNIQUES TO EVALUATE MULTICORE SOFT ERROR RELIABILITY |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
FELIPE ROCHA DA ROSA |
2018
|
Título |
Título Periódico |
Autor Principal |
|
A FAST AND ACCURATE HYBRID FAULT INJECTION PLATFORM FOR TRANSIENT AND PERMANENT FAULTS |
DESIGN AUTOMATION FOR EMBEDDED SYSTEMS |
ANDERSON LUIZ SARTOR |
|
A NOVEL RESECTION-INTERSECTION ALGORITHM WITH FAST TRIANGULATION APPLIED TO MONOCULAR VISUAL ODOMETRY |
IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS (PRINT) |
FABIO IRIGON PEREIRA |
|
A 0.12-0.4 V, VERSATILE 3-TRANSISTOR CMOS VOLTAGE REFERENCE FOR ULTRA-LOW POWER SYSTEMS |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
ARTHUR CAMPOS DE OLIVEIRA |
|
ANALYSIS OF 6-T SRAM CELL IN SUB-45-NM CMOS AND FINFET TECHNOLOGIES |
MICROELECTRONICS AND RELIABILITY |
ROBERTO BORBA DE ALMEIDA |
|
ANOMALOUS CURRENT-VOLTAGE BEHAVIOR IN AL/TIO /N-SI STRUCTURES |
PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS (PRINT) |
RICARDO AUGUSTO ZANOTTO RAZERA |
|
BRAM-BASED FUNCTION REUSE FOR MULTI-CORE ARCHITECTURES IN FPGAS |
MICROPROCESSORS AND MICROSYSTEMS |
PEDRO HENRIQUE EXENBERGER BECKER |
|
CHARACTERIZATION OF A SIC MIS SCHOTTKY DIODE AS RBS PARTICLE DETECTOR |
JOURNAL OF INSTRUMENTATION |
IVAN RODRIGO KAUFMANN |
|
CHEMICAL AND MORPHOLOGICAL MODIFICATIONS OF SINGLE LAYER GRAPHENE SUBMITTED TO ANNEALING IN WATER VAPOR |
APPLIED SURFACE SCIENCE |
GUILHERME KOSZENIEWSKI ROLIM |
|
DESIGN FLOW METHODOLOGY FOR RADIATION HARDENED BY DESIGN CMOS ENCLOSED-LAYOUT-TRANSISTOR-BASED STANDARD-CELL LIBRARY |
JOURNAL OF ELECTRONIC TESTING |
PABLO ILHA VAZ |
|
DESIGN OF APPROXIMATE-TMR USING APPROXIMATE LIBRARY AND HEURISTIC APPROACHES |
MICROELECTRONICS AND RELIABILITY |
IURI ALBANDES CUNHA GOMES |
|
EFFECTIVE LOGIC SYNTHESIS FOR THRESHOLD LOGIC CIRCUIT DESIGN |
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS |
AUGUSTO NEUTZLING SILVA |
|
EFFICIENTLY MAPPING VLSI CIRCUITS WITH SIMPLE CELLS |
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS |
JODY MAICK ARAUJO DE MATOS |
|
ENERGY AND RATE-AWARE DESIGN FOR HEVC MOTION ESTIMATION BASED ON PARETO EFFICIENCY |
JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (IMPRESSO) |
BRUNO ZATT |
|
ENERGY-DELAY-FIT PRODUCT TO COMPARE PROCESSORS AND ALGORITHM IMPLEMENTATIONS |
MICROELECTRONICS AND RELIABILITY |
VINICIUS FRATIN NETTO |
|
EVALUATING THE RELIABILITY OF A GPU PIPELINE TO SEU AND THE IMPACTS OF SOFTWARE-BASED AND HARDWARE-BASED FAULT TOLERANCE TECHNIQUES |
MICROELECTRONICS AND RELIABILITY |
MARCIO MACEDO GONCALVES |
|
EVALUATION OF VARIABILITY USING SCHMITT TRIGGER ON FULL ADDERS LAYOUT |
MICROELECTRONICS AND RELIABILITY |
LEONARDO BARLETTE DE MORAES |
|
GROWTH OF BORON-DOPED FEW-LAYER GRAPHENE BY MOLECULAR BEAM EPITAXY |
APPLIED PHYSICS LETTERS |
GABRIEL VIEIRA SOARES |
|
IMPACT OF DIFFERENT TRANSISTOR ARRANGEMENTS ON GATE VARIABILITY |
MICROELECTRONICS AND RELIABILITY |
ALEXANDRA LACKMANN ZIMPECK |
|
IMPROVING NETWORK RESOURCES ALLOCATION IN SMART CITIES VIDEO SURVEILLANCE |
COMPUTER NETWORKS |
RAFAEL KUNST |
|
KERNEL AND LAYER VULNERABILITY FACTOR TO EVALUATE OBJECT DETECTION RELIABILITY IN GPUS |
IET COMPUTERS & DIGITAL TECHNIQUES (PRINT) |
FERNANDO FERNANDES DOS SANTOS |
|
LOCKSTEP DUAL-CORE ARM A9: IMPLEMENTATION AND RESILIENCE ANALYSIS UNDER HEAVY ION INDUCED SOFT ERRORS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
ADRIA BARROS DE OLIVEIRA |
|
ON THE EFFICACY OF ECC AND THE BENEFITS OF FINFET TRANSISTOR LAYOUT FOR GPU RELIABILITY |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
CAIO BRIGAGAO LUNARDI |
|
OPTIMIZED SOLUTION TO ACCELERATE IN HARDWARE AN INTRA H.264/SVC VIDEO ENCODER |
IEEE MICRO |
RONALDO HUSEMANN |
|
PHOTOLUMINESCENCE PROPERTIES OF ARSENIC AND BORON DOPED SI N NANOCRYSTAL EMBEDDED IN SIN O MATRIX |
MATERIALS RESEARCH EXPRESS |
DENISE PUGLIA |
|
RELIABILITY-PERFORMANCE ANALYSIS OF HARDWARE AND SOFTWARE CO-DESIGNS IN SRAM-BASED APSOCS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
LUCAS ANTUNES TAMBARA |
|
REVERSIBILITY OF GRAPHENE PHOTOCHLORINATION |
JOURNAL OF PHYSICAL CHEMISTRY. C |
GABRIELA COPETTI |
|
TID EFFECTS ON A DATA ACQUISITION SYSTEM WITH DESIGN DIVERSITY REDUNDANCY |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
CARLOS JULIO GONZALEZ AGUILERA |
|
40-NM CMOS WIDEBAND HIGH-IF RECEIVER USING A MODIFIED CHARGE-SHARING BANDPASS FILTER TO BOOST Q-FACTOR |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
FILIPE DIAS BAUMGRATZ |
2017
|
Título |
Título Periódico |
Autor Principal |
|
A COMPACT MODEL FOR THE STATISTICS OF THE LOW-FREQUENCY NOISE OF MOSFETS WITH LATERALLY UNIFORM DOPING |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
MAURICIO BANASZESKI DA SILVA |
|
A HIGH-PSR EMI-RESISTANT NMOS-ONLY VOLTAGE REFERENCE USING ZERO- $V_T$ ACTIVE LOADS |
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY (PRINT) |
DAVID JAVIER CORDOVA VIVAS |
|
A LOW-LEVEL SOFTWARE-BASED FAULT TOLERANCE APPROACH TO DETECT SEUS IN GPUS' REGISTER FILES |
MICROELECTRONICS AND RELIABILITY |
MARCIO MACEDO GONCALVES |
|
A SIMPLE AND EFFECTIVE HEURISTIC METHOD FOR THRESHOLD LOGIC IDENTIFICATION |
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS |
AUGUSTO NEUTZLING SILVA |
|
A 0.4-3.3 GHZ LOW-NOISE VARIABLE GAIN AMPLIFIER WITH 35 DB TUNING RANGE, 4.9 DB NF, AND 40 DBM IIP2 |
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING |
FILIPE DIAS BAUMGRATZ |
|
ANALYZING RELIABILITY AND PERFORMANCE TRADE-OFFS OF HLS-BASED DESIGNS IN SRAM-BASED FPGAS UNDER SOFT ERRORS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
LUCAS ANTUNES TAMBARA |
|
ANALYZING THE IMPACT OF FAULT TOLERANCE METHODS IN ARM PROCESSORS UNDER SOFT ERRORS RUNNING LINUX AND PARALLELIZATION APIS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
GENNARO SEVERINO RODRIGUES |
|
ANALYZING THE IMPACT OF RADIATION-INDUCED FAILURES IN FLASH-BASED APSOC WITH AND WITHOUT FAULT TOLERANCE TECHNIQUES AT CERN ENVIRONMENT |
MICROELECTRONICS AND RELIABILITY |
LUCAS ANTUNES TAMBARA |
|
ANALYZING THE INFLUENCE OF THE ANGLES OF INCIDENCE AND ROTATION ON MBU EVENTS INDUCED BY LOW LET HEAVY IONS IN A 28-NM SRAM-BASED FPGA |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
JORGE LUCIO TONFAT SECLEN |
|
AUTOCORRELATION ANALYSIS AS A TECHNIQUE TO STUDY PHYSICAL MECHANISMS OF MOSFET LOW-FREQUENCY NOISE |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
THIAGO HANNA BOTH |
|
BROADENING MOLECULAR WEIGHT POLYETHYLENE DISTRIBUTION BY TAILORING THE SILICA SURFACE ENVIRONMENT ON SUPPORTED METALLOCENES |
APPLIED SURFACE SCIENCE |
ELIANA CRISTINA GALLAND BARRERA |
|
CHEMICAL AND MORPHOLOGICAL MODIFICATIONS OF SINGLE LAYER GRAPHENE SUBMITTED TO ANNEALING IN WATER VAPOR |
APPLIED SURFACE SCIENCE |
GUILHERME KOSZENIEWSKI ROLIM |
|
DETERMINISTIC METHODOLOGY FOR ELECTRICAL SIMULATION OF BTI INDUCED PULSE BROADENING |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY |
GABRIELA FIRPO FURTADO |
|
ELECTRON IRRADIATION EFFECTS ON THE NUCLEATION AND GROWTH OF AU NANOPARTICLES IN SILICON NITRIDE MEMBRANES |
JOURNAL OF APPLIED PHYSICS |
MARIANA DE MELLO TIMM |
|
ENERGY-AWARE CACHE HIERARCHY ASSESSMENT TARGETING HEVC ENCODER EXECUTION |
JOURNAL OF REAL-TIME IMAGE PROCESSING (PRINT) |
EDUARDA RODRIGUES MONTEIRO |
|
EVALUATION OF HEAVY-ION IMPACT IN BULK AND FDSOI DEVICES UNDER ZTC CONDITION |
MICROELECTRONICS AND RELIABILITY |
WALTER ENRIQUE CALIENES BARTRA |
|
EVALUATION OF RADIATION-INDUCED SOFT ERROR IN MAJORITY VOTERS DESIGNED IN 7 NM FINFET TECHNOLOGY |
MICROELECTRONICS AND RELIABILITY |
YGOR QUADROS DE AGUIAR |
|
EXPLOITING IDLE HARDWARE TO PROVIDE LOW OVERHEAD FAULT TOLERANCE FOR VLIW PROCESSORS |
ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS |
ANDERSON LUIZ SARTOR |
|
INVERTER CIRCUITS ON FREESTANDING FLEXIBLE SUBSTRATE USING ZNO NANOPARTICLES FOR COST-EFFICIENT ELECTRONICS |
SOLID-STATE ELECTRONICS |
FABIO FEDRIZZI VIDOR |
|
MODELING AND SIMULATION OF THE CHARGE TRAPPING COMPONENT OF BTI AND RTS |
MICROELECTRONICS AND RELIABILITY |
THIAGO HANNA BOTH |
|
MODELS OF COMPUTATION FOR NOC MAPPING: TIMING AND ENERGY SAVING AWARENESS |
MICROELECTRONICS JOURNAL |
CESAR AUGUSTO MISSIO MARCON |
|
ON THE RELIABILITY OF LINEAR REGRESSION AND PATTERN RECOGNITION FEED-FORWARD ARTIFICIAL NEURAL NETWORKS IN FPGAS |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
FABIANO PEREIRA LIBANO |
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PERFORMANCE AND SIMULATION ACCURACY EVALUATION OF ANALOG CIRCUITS WITH ENCLOSED LAYOUT TRANSISTORS |
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GUILHERME SCHWANKE CARDOSO |
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PICOWATT, 0.45-0.6 V SELF-BIASED SUBTHRESHOLD CMOS VOLTAGE REFERENCE |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
ARTHUR CAMPOS DE OLIVEIRA |
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POWER-EFFICIENT SUM OF ABSOLUTE DIFFERENCES HARDWARE ARCHITECTURE USING ADDER COMPRESSORS FOR INTEGER MOTION ESTIMATION DESIGN |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS (PRINT) |
BIANCA SANTOS DA CUNHA DA SILVEIRA |
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REGISTER FILE CRITICALITY AND COMPILER OPTIMIZATION EFFECTS ON EMBEDDED MICROPROCESSORS RELIABILITY |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
FILIPE MACIEL LINS |
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SAT-BASED FORMULATION FOR LOGICAL CAPACITY EVALUATION OF VIA-CONFIGURABLE STRUCTURED ASIC |
IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING |
VINICIUS DAL BEM |
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SINGLE EVENT TRANSIENT EFFECTS ON CHARGE REDISTRIBUTION SAR ADCS |
MICROELECTRONICS AND RELIABILITY |
THALES EXENBERGER BECKER |
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SOFT ERROR SUSCEPTIBILITY ANALYSIS METHODOLOGY OF HLS DESIGNS IN SRAM-BASED FPGAS |
MICROPROCESSORS AND MICROSYSTEMS |
JORGE LUCIO TONFAT SECLEN |
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SYSTEM DESIGN OF A 2.75-MW DISCRETE-TIME SUPERHETERODYNE RECEIVER FOR BLUETOOTH LOW ENERGY |
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES |
SANDRO BINSFELD FERREIRA |
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TIMING ATTACK ON NOC-BASED SYSTEMS: PRIME+PROBE ATTACK AND NOC-BASED PROTECTION |
MICROPROCESSORS AND MICROSYSTEMS |
CEZAR RODOLFO WEDIG REINBRECHT |
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TOTAL DOSE EFFECTS ON VOLTAGE REFERENCES IN 130 NM CMOS TECHNOLOGY |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY |
DALTON MARTINI COLOMBO |
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UMA ABORDAGEM DE TOLERÂNCIA A FALHAS BASEADA EM SOFTWARE DE BAIXO NÍVEL PARA DETECTAR SEUS EM BANCOS DE REGISTRADORES DE GPUS |
REVISTA JUNIOR DE INICIAÇÃO CIENTÍFICA EM CIÊNCIAS EXATAS E ENGENHARIA |
MARCIO MACEDO GONCALVES |
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UNRAVELING THE MECHANISMS RESPONSIBLE FOR THE INTERFACIAL REGION FORMATION IN 4H-SIC DRY THERMAL OXIDATION |
JOURNAL OF APPLIED PHYSICS |
GUSTAVO HENRIQUE STEDILE DARTORA |
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4H-SIC SURFACE ENERGY TUNING BY NITROGEN UP-TAKE |
APPLIED SURFACE SCIENCE |
EDUARDO PITTHAN FILHO |
