{"id":5947,"date":"2020-05-19T15:18:00","date_gmt":"2020-05-19T18:18:00","guid":{"rendered":"https:\/\/www.ufrgs.br\/ppgee\/?post_type=capitulo_de_livros&#038;p=5947"},"modified":"2024-02-19T15:30:07","modified_gmt":"2024-02-19T18:30:07","slug":"an-overview-on-statistical-modeling-of-random-telegraph-noise-in-the-frequency-domain","status":"publish","type":"capitulo_de_livros","link":"https:\/\/www.ufrgs.br\/ppgee\/capitulo-de-livros\/an-overview-on-statistical-modeling-of-random-telegraph-noise-in-the-frequency-domain\/","title":{"rendered":"AN OVERVIEW ON STATISTICAL MODELING OF RANDOM TELEGRAPH NOISE IN THE FREQUENCY DOMAIN"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">BOTH, T, WIRTH, G. I., MAURICIO BANASZESKI DA SILVA, TUINHOUT, HANS P.,DUIJNHOVEN, ADRIE ZEGERS-VAN, CROON, JEROEN A., Andries Scholten, AN OVERVIEW ON STATISTICAL MODELING OF RANDOM TELEGRAPH NOISE IN THE FREQUENCY DOMAIN. In: Noise in Nanoscale Semiconductor Devices, ISBN: 9783030374990, Springer International Publishing; URL: http:\/\/link.springer.com\/10.1007\/978-3-030-37500-3_15, 2020.<\/p>\n","protected":false},"template":"","categoria_cap":[268],"class_list":["post-5947","capitulo_de_livros","type-capitulo_de_livros","status-publish","hentry","categoria_cap-gilson-inacio-wirth"],"_links":{"self":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/capitulo_de_livros\/5947","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/capitulo_de_livros"}],"about":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/types\/capitulo_de_livros"}],"wp:attachment":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/media?parent=5947"}],"wp:term":[{"taxonomy":"categoria_cap","embeddable":true,"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/categoria_cap?post=5947"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}