{"id":4824,"date":"2021-06-12T15:35:24","date_gmt":"2021-06-12T18:35:24","guid":{"rendered":"https:\/\/www.ufrgs.br\/ppgee\/?post_type=professor&#038;p=4824"},"modified":"2024-02-19T16:07:07","modified_gmt":"2024-02-19T19:07:07","slug":"gilson-inacio-wirth","status":"publish","type":"professor","link":"https:\/\/www.ufrgs.br\/ppgee\/professor\/gilson-inacio-wirth\/","title":{"rendered":"Gilson In\u00e1cio Wirth"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-post\" data-elementor-id=\"4824\" class=\"elementor elementor-4824\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-5107cbf6 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"5107cbf6\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-41e7fa8b\" data-id=\"41e7fa8b\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-inner-section elementor-element elementor-element-7c94be13 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"7c94be13\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-inner-column elementor-element elementor-element-414ef321\" data-id=\"414ef321\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-f29155d elementor-widget elementor-widget-image\" data-id=\"f29155d\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"115\" height=\"111\" src=\"https:\/\/www.ufrgs.br\/ppgee\/wp-content\/uploads\/2023\/06\/Gilson-Inacio-Wirth.jpg\" class=\"attachment-thumbnail size-thumbnail wp-image-1542\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-inner-column elementor-element elementor-element-38af6641\" data-id=\"38af6641\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-8d579c elementor-widget elementor-widget-heading\" data-id=\"8d579c\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Gilson In\u00e1cio Wirth<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<div class=\"elementor-element elementor-element-40748723 elementor-widget elementor-widget-text-editor\" data-id=\"40748723\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<ul><li>Orientador de Mestrado e Doutorado &#8211; Docente Permanente<\/li><li>Bolsista de Produtividade em Pesquisa 1C CNPq<\/li><li>Doutor em Engenharia El\u00e9trica, Universitaet Dortmund, Unido, ALEMANHA.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-d03927b elementor-widget-divider--view-line elementor-widget elementor-widget-divider\" data-id=\"d03927b\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-68c3e139 elementor-widget elementor-widget-text-editor\" data-id=\"68c3e139\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong><span style=\"color: var( --e-global-color-text ); font-family: var( --e-global-typography-text-font-family ), Sans-serif; background-color: var(--nv-site-bg); font-size: var(--bodyfontsize); letter-spacing: var(--bodyletterspacing); text-transform: var(--bodytexttransform);\">E-mail:<\/span><\/strong><span style=\"color: var( --e-global-color-text ); font-family: var( --e-global-typography-text-font-family ), Sans-serif; background-color: var(--nv-site-bg); font-size: var(--bodyfontsize); letter-spacing: var(--bodyletterspacing); text-transform: var(--bodytexttransform);\">\u00a0<\/span><a href=\"mailto:gilson.wirth@ufrgs.br\"><span style=\"color: #272626; font-family: Arial, Helvetica, sans-serif, Arial, Helvetica, sans-serif; font-size: 14.4px;\">gilson.wirth@ufrgs.br<\/span><\/a><strong><span style=\"color: var( --e-global-color-text ); font-family: var( --e-global-typography-text-font-family ), Sans-serif; background-color: var(--nv-site-bg); font-size: var(--bodyfontsize); letter-spacing: var(--bodyletterspacing); text-transform: var(--bodytexttransform);\"><br \/><\/span>CV Lattes:\u00a0<\/strong><a style=\"--linkdeco: underline; text-decoration: var(--linkdeco); opacity: 0.9; font-family: Arial, Helvetica, sans-serif, Arial, Helvetica, sans-serif; font-size: 14.4px;\" href=\"http:\/\/lattes.cnpq.br\/1745194055679908\" target=\"_blank\" rel=\"noreferrer noopener\">http:\/\/lattes.cnpq.br\/1745194055679908<\/a><br \/><strong>ORCID:\u00a0<\/strong><a style=\"font-weight: var( --e-global-typography-text-font-weight ); background-color: var(--nv-site-bg); letter-spacing: var(--bodyletterspacing); text-transform: var(--bodytexttransform); --linkdeco: underline; text-decoration: var(--linkdeco); font-family: Arial, Helvetica, sans-serif, Arial, Helvetica, sans-serif; font-size: 14.4px;\" href=\"https:\/\/orcid.org\/0000-0002-4990-5113\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/orcid.org\/0000-0002-4990-5113<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-254fe319 elementor-widget-divider--view-line elementor-widget elementor-widget-divider\" data-id=\"254fe319\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-12b75fbe elementor-widget elementor-widget-text-editor\" data-id=\"12b75fbe\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<ul><li>Microeletr\u00f4nica;<\/li><li>Modelagem de Dispositivos MOS; <\/li><li>Materiais e Componentes Semicondutores.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-4efc51ea elementor-widget elementor-widget-heading\" data-id=\"4efc51ea\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Orienta\u00e7\u00f5es de teses conclu\u00eddas<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-48ea68c3 elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"48ea68c3\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-48ea68c3\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-48ea68c3 eael-post-grid-style-two\" data-layout-mode=\"masonry\"><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-4544\" data-id=\"4544\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/tese\/electrical-characterization-and-modeling-of-random-telegraph-noise-in-mim-like-resistive-switching-devices\/\" title=\"ELECTRICAL CHARACTERIZATION AND MODELING OF RANDOM TELEGRAPH NOISE IN MIM-LIKE RESISTIVE SWITCHING DEVICES\">ELECTRICAL CHARACTERIZATION AND MODELING OF RANDOM TELEGRAPH NOISE IN MIM-LIKE RESISTIVE SWITCHING DEVICES<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Aluno:&nbsp;Thales Exenberger Becker Orientador:&nbsp;Gilson In\u00e1cio Wirth T\u00edtulo:&nbsp;ELECTRICAL CHARACTERIZATION AND MODELING OF RANDOM TELEGRAPH NOISE IN MIM-LIKE RESISTIVE SWITCHING DEVICES \u00c1rea de Concentra\u00e7\u00e3o:&nbsp;Engenharia da Computa\u00e7\u00e3o Data da defesa:&nbsp;15\/03\/2022Reposit\u00f3rio Digital (LUME \/UFRGS): https:\/\/lume.ufrgs.br\/handle\/10183\/241913<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><span class=\"eael-meta-posted-on\"><i class=\"far fa-clock\"><\/i><time datetime=\"15 de mar\u00e7o de 2022\">15 de mar\u00e7o de 2022<\/time><\/span><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5054\" data-id=\"5054\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/tese\/sensor-de-corrente-transiente-para-um-sistema-de-protecao-de-circuitos-interligados-contra-erros-induzidos-por-radiacao-ionizante\/\" title=\"Sensor de Corrente Transiente para um Sistema de Prote\u00e7\u00e3o de Circuitos Interligados Contra Erros Induzidos por Radia\u00e7\u00e3o Ionizante\">Sensor de Corrente Transiente para um Sistema de Prote\u00e7\u00e3o de Circuitos Interligados Contra Erros Induzidos por Radia\u00e7\u00e3o Ionizante<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Aluno:&nbsp;Alexandre SimionovskiOrientador:&nbsp;Gilson In\u00e1cio WirthT\u00edtulo:&nbsp;Sensor de Corrente Transiente para um Sistema de Prote\u00e7\u00e3o de Circuitos Interligados Contra Erros Induzidos por Radia\u00e7\u00e3o Ionizante\u00c1rea de Concentra\u00e7\u00e3o:&nbsp;Engenharia de Computa\u00e7\u00e3oData da defesa:&nbsp;23\/03\/2018<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><span class=\"eael-meta-posted-on\"><i class=\"far fa-clock\"><\/i><time datetime=\"23 de mar\u00e7o de 2018\">23 de mar\u00e7o de 2018<\/time><\/span><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-67f4bbc9 elementor-widget elementor-widget-heading\" data-id=\"67f4bbc9\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Orienta\u00e7\u00f5es de disserta\u00e7\u00f5es conclu\u00eddas<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-cba98df elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"cba98df\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-cba98df\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-cba98df eael-post-grid-style-two\" data-layout-mode=\"masonry\"><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-7505\" data-id=\"7505\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/dissertacao\/analise-de-jitter-causado-pelo-random-telegraph-noise-em-um-oscilador-em-anel\/\" title=\"AN\u00c1LISE DE JITTER CAUSADO PELO RANDOM TELEGRAPH NOISE EM UM OSCILADOR EM ANEL\">AN\u00c1LISE DE JITTER CAUSADO PELO RANDOM TELEGRAPH NOISE EM UM OSCILADOR EM ANEL<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Aluno: Rodolfo Grosbelli Barbosa Orientador: Gilson In\u00e1cio Wirth Coorientador: F\u00e1bio Fedrizzi Vidor T\u00edtulo: AN\u00c1LISE DE JITTER CAUSADO PELO RANDOM TELEGRAPH NOISE EM UM OSCILADOR EM ANEL \u00c1rea de Concentra\u00e7\u00e3o: Eletr\u00f4nica Data da Defesa: 18\/03\/2024 Reposit\u00f3rio Digital (LUME \/ UFRGS): https:\/\/lume.ufrgs.br\/handle\/10183\/277052<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><span class=\"eael-meta-posted-on\"><i class=\"far fa-clock\"><\/i><time datetime=\"18 de mar\u00e7o de 2024\">18 de mar\u00e7o de 2024<\/time><\/span><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-4689\" data-id=\"4689\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/dissertacao\/implementacao-e-comparacao-de-algoritmos-para-extracao-de-parametros-de-rtn\/\" title=\"IMPLEMENTA\u00c7\u00c3O E COMPARA\u00c7\u00c3O DE ALGORITMOS PARA EXTRA\u00c7\u00c3O DE PAR\u00c2METROS DE RTN\">IMPLEMENTA\u00c7\u00c3O E COMPARA\u00c7\u00c3O DE ALGORITMOS PARA EXTRA\u00c7\u00c3O DE PAR\u00c2METROS DE RTN<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Aluno:\u00a0Cl\u00e1udia Theis da SilveiraOrientador:\u00a0Gilson In\u00e1cio WirthT\u00edtulo:\u00a0IMPLEMENTA\u00c7\u00c3O E COMPARA\u00c7\u00c3O DE ALGORITMOS PARA EXTRA\u00c7\u00c3O DE PAR\u00c2METROS DE RTN\u00c1rea de Concentra\u00e7\u00e3o:\u00a0Engenharia de Computa\u00e7\u00e3oData da defesa:\u00a030\/04\/2021Reposit\u00f3rio Digital (LUME \/UFRGS): https:\/\/lume.ufrgs.br\/handle\/10183\/224414<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><span class=\"eael-meta-posted-on\"><i class=\"far fa-clock\"><\/i><time datetime=\"30 de abril de 2021\">30 de abril de 2021<\/time><\/span><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5222\" data-id=\"5222\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/dissertacao\/trapsimulator-um-simulador-didatico-de-ruido-rtn\/\" title=\"Trapsimulator \u2013 Um Simulador Did\u00e1tico de Ruido RTN\">Trapsimulator \u2013 Um Simulador Did\u00e1tico de Ruido RTN<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Aluno:&nbsp;Ricardo Carvalho de MelosOrientador:&nbsp;Gilson In\u00e1cio WirthT\u00edtulo:&nbsp;Trapsimulator \u2013 Um Simulador Did\u00e1tico de Ruido RTN\u00c1rea de Concentra\u00e7\u00e3o:&nbsp;Engenharia de Computa\u00e7\u00e3oData da defesa:&nbsp;16\/03\/2018<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><span class=\"eael-meta-posted-on\"><i class=\"far fa-clock\"><\/i><time datetime=\"16 de mar\u00e7o de 2018\">16 de mar\u00e7o de 2018<\/time><\/span><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5227\" data-id=\"5227\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/dissertacao\/caracterizacao-eletrica-temporal-de-transistores-de-filmes-finos-de-nanoparticulas-de-oxido-de-zinco\/\" title=\"Caracteriza\u00e7\u00e3o El\u00e9trica Temporal de Transistores de Filmes Finos de Nanopart\u00edculas de \u00d3xido de Zinco\">Caracteriza\u00e7\u00e3o El\u00e9trica Temporal de Transistores de Filmes Finos de Nanopart\u00edculas de \u00d3xido de Zinco<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Aluno:&nbsp;Thales Exenberger BeckerOrientador:&nbsp;Gilson In\u00e1cio WirthT\u00edtulo:&nbsp;Caracteriza\u00e7\u00e3o El\u00e9trica Temporal de Transistores de Filmes Finos de Nanopart\u00edculas de \u00d3xido de Zinco\u00c1rea de Concentra\u00e7\u00e3o:&nbsp;Engenharia de Computa\u00e7\u00e3oData da defesa:&nbsp;26\/02\/2018<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><span class=\"eael-meta-posted-on\"><i class=\"far fa-clock\"><\/i><time datetime=\"26 de fevereiro de 2018\">26 de fevereiro de 2018<\/time><\/span><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>            <div class=\"eael-load-more-button-wrap\">\n                <button class=\"eael-load-more-button\" id=\"eael-load-more-btn-cba98df\" data-widget-id=\"cba98df\" data-widget=\"cba98df\" data-page-id=\"4824\" data-template=\"{&quot;dir&quot;:&quot;lite&quot;,&quot;file_name&quot;:&quot;two.php&quot;,&quot;name&quot;:&quot;Post-Grid&quot;}\" data-class=\"Essential_Addons_Elementor\\Elements\\Post_Grid\" data-layout=\"masonry\" data-page=\"1\" data-args=\"orderby=date&amp;order=desc&amp;ignore_sticky_posts=1&amp;post_status=publish&amp;posts_per_page=4&amp;offset=0&amp;post_type=dissertacao&amp;tax_query%5B0%5D%5Btaxonomy%5D=categoria_diss&amp;tax_query%5B0%5D%5Bfield%5D=term_id&amp;tax_query%5B0%5D%5Bterms%5D%5B0%5D=167&amp;tax_query%5Brelation%5D=AND&amp;eael_args_sig=90e9d215d0975d5c488b8eb407bff8e322e3479be11c4055d3bff99bd27905c4\" data-max-page=\"3\">\n                    <span class=\"eael-btn-loader button__loader\"><\/span>\n                    <span class=\"eael_load_more_text\">Carregar mais<\/span>\n                <\/button>\n            <\/div>\n            \t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-58800510 elementor-widget elementor-widget-heading\" data-id=\"58800510\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Artigos<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-37aa2b65 elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"37aa2b65\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-37aa2b65\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-37aa2b65 eael-post-grid-style-two\" data-layout-mode=\"masonry\"><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-7545\" data-id=\"7545\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/artigo\/the-role-of-the-observation-window-in-the-determination-of-bti-defect-time-constants-and-their-distribution\/\" title=\"The role of the observation window in the determination of BTI defect time constants and their distribution\">The role of the observation window in the determination of BTI defect time constants and their distribution<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>LAZARINI, Arthur Yukio Hirata; WIRTH, Gilson Inacio. The role of the observation window in the determination of BTI defect time constants and their distribution. Journal of Integrated Circuits and Systems, v. 19, n. 2, p. 1-5, 2024. DOI: https:\/\/doi.org\/10.29292\/jics.v19i2.855.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-6514\" data-id=\"6514\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/artigo\/random-telegraph-noise-in-analog-cmos-circuits\/\" title=\"RANDOM TELEGRAPH NOISE IN ANALOG CMOS CIRCUITS\">RANDOM TELEGRAPH NOISE IN ANALOG CMOS CIRCUITS<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>M. B. da Silva, G. I. Wirth, H. P. Tuinhout, A. Z. -v. Duijnhoven and A. J. Scholten, &#8220;Random Telegraph Noise in Analog CMOS Circuits,&#8221; in\u00a0IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 70, no. 6, pp. 2229-2242, June 2023, doi: 10.1109\/TCSI.2023.3261564.\u00a0<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-6513\" data-id=\"6513\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/artigo\/random-telegraph-noise-based-true-random-number-generator-for-fully-integrated-systems\/\" title=\"RANDOM TELEGRAPH NOISE BASED TRUE RANDOM NUMBER GENERATOR FOR FULLY INTEGRATED SYSTEMS\">RANDOM TELEGRAPH NOISE BASED TRUE RANDOM NUMBER GENERATOR FOR FULLY INTEGRATED SYSTEMS<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>Wirth, Gilson; ALVES, PEDRO A B ;\u00a0da Silva, Roberto\u00a0. Random Telegraph Noise based True Random Number Generator for Fully Integrated Systems. FLUCTUATION AND NOISE LETTERS, v. 2023, p. 1, 2023.doi.org\/10.1142\/S021947752350027X<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-6510\" data-id=\"6510\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/artigo\/jitter-due-to-random-telegraph-noise-a-study-on-the-time-dependent-variability-of-a-ring-oscillator\/\" title=\"JITTER DUE TO RANDOM TELEGRAPH NOISE: A STUDY ON THE TIME DEPENDENT VARIABILITY OF A RING OSCILLATOR\">JITTER DUE TO RANDOM TELEGRAPH NOISE: A STUDY ON THE TIME DEPENDENT VARIABILITY OF A RING OSCILLATOR<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>GROSBELLI BARBOSA, RODOLFO ; PINHEIRO GARCIA, CAROLINE ; FEDRIZZI VIDOR, F\u00b4ABIO ;\u00a0IN\u00b4ACIO WIRTH, GILSON\u00a0. Jitter due to Random Telegraph Noise: a Study on the Time Dependent Variability of a Ring Oscillator. JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGU\u00caS), v. 18, p. 1-9, 2023.doi.org\/10.29292\/jics.v18i3.778<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>            <div class=\"eael-load-more-button-wrap\">\n                <button class=\"eael-load-more-button\" id=\"eael-load-more-btn-37aa2b65\" data-widget-id=\"37aa2b65\" data-widget=\"37aa2b65\" data-page-id=\"4824\" data-template=\"{&quot;dir&quot;:&quot;lite&quot;,&quot;file_name&quot;:&quot;two.php&quot;,&quot;name&quot;:&quot;Post-Grid&quot;}\" data-class=\"Essential_Addons_Elementor\\Elements\\Post_Grid\" data-layout=\"masonry\" data-page=\"1\" data-args=\"orderby=date&amp;order=desc&amp;ignore_sticky_posts=1&amp;post_status=publish&amp;posts_per_page=4&amp;offset=0&amp;post_type=artigo&amp;tax_query%5B0%5D%5Btaxonomy%5D=categoria_art&amp;tax_query%5B0%5D%5Bfield%5D=term_id&amp;tax_query%5B0%5D%5Bterms%5D%5B0%5D=219&amp;tax_query%5Brelation%5D=AND&amp;eael_args_sig=665b0bebf2264e42f5543c60a94126450a5927f7b07fedecb000848d1308bd9c\" data-max-page=\"6\">\n                    <span class=\"eael-btn-loader button__loader\"><\/span>\n                    <span class=\"eael_load_more_text\">Carregar mais<\/span>\n                <\/button>\n            <\/div>\n            \t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-6206fb7 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"6206fb7\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-0553d41\" data-id=\"0553d41\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-6f93761 elementor-widget elementor-widget-heading\" data-id=\"6f93761\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Livros<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-18831ee elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"18831ee\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-18831ee\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-18831ee eael-post-grid-style-two\" data-layout-mode=\"masonry\"><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5919\" data-id=\"5919\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/livro\/zno-thin-film-transistors-for-cost-efficient-flexible-electronics\/\" title=\"ZNO THIN-FILM TRANSISTORS FOR COST-EFFICIENT FLEXIBLE ELECTRONICS\">ZNO THIN-FILM TRANSISTORS FOR COST-EFFICIENT FLEXIBLE ELECTRONICS<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>VIDOR, F. F, WIRTH, G. I., HELLERINGMANN, U., , : ZNO THIN-FILM TRANSISTORS FOR COST-EFFICIENT FLEXIBLE ELECTRONICS, ISBN: 9783319725550, Springer International Publishing; http:\/\/link.springer.com\/10.1007\/978-3-319-72556-7, 2018.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5917\" data-id=\"5917\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/livro\/protecting-chips-against-hold-time-violations-due-to-variability\/\" title=\"PROTECTING CHIPS AGAINST HOLD TIME VIOLATIONS DUE TO VARIABILITY\">PROTECTING CHIPS AGAINST HOLD TIME VIOLATIONS DUE TO VARIABILITY<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>NEUBERGER, G., WIRTH, G. I., REIS, R. A. L., , PROTECTING CHIPS AGAINST HOLD TIME VIOLATIONS DUE TO VARIABILITY, ISBN: 9789400724273, Springer. https:\/\/www.springer.com\/br\/book\/9789400724266, 2014.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-e42c8d2 elementor-widget elementor-widget-heading\" data-id=\"e42c8d2\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Cap\u00edtulo de Livros<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-98b7c0c elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"98b7c0c\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-98b7c0c\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-98b7c0c eael-post-grid-style-two\" data-layout-mode=\"masonry\"><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5947\" data-id=\"5947\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/capitulo-de-livros\/an-overview-on-statistical-modeling-of-random-telegraph-noise-in-the-frequency-domain\/\" title=\"AN OVERVIEW ON STATISTICAL MODELING OF RANDOM TELEGRAPH NOISE IN THE FREQUENCY DOMAIN\">AN OVERVIEW ON STATISTICAL MODELING OF RANDOM TELEGRAPH NOISE IN THE FREQUENCY DOMAIN<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>BOTH, T, WIRTH, G. I., MAURICIO BANASZESKI DA SILVA, TUINHOUT, HANS P.,DUIJNHOVEN, ADRIE ZEGERS-VAN, CROON, JEROEN A., Andries Scholten, AN OVERVIEW ON STATISTICAL MODELING OF RANDOM TELEGRAPH NOISE IN THE FREQUENCY DOMAIN. In: Noise in Nanoscale Semiconductor Devices, ISBN: 9783030374990, Springer International Publishing; URL: http:\/\/link.springer.com\/10.1007\/978-3-030-37500-3_15, 2020.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5929\" data-id=\"5929\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/capitulo-de-livros\/charge-trapping-in-mosfets-bti-and-rtn-modeling-for-circuits\/\" title=\"CHARGE TRAPPING IN MOSFETS: BTI AND RTN MODELING FOR CIRCUITS\">CHARGE TRAPPING IN MOSFETS: BTI AND RTN MODELING FOR CIRCUITS<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>WIRTH, G. I., CAO, YU, VELAMALA, J. B. A., SUTARIA, K. B., SATO, T., , CHARGE TRAPPING IN MOSFETS: BTI AND RTN MODELING FOR CIRCUITS. In: Bias Temperature Instability for Devices and Circuits, ISBN: 978-1-4614-7908-6 (Print) 978-1-4614-7909-3 (Online), Springer. http:\/\/link.springer.com\/book\/10.1007\/978-1-4614-7909-3\/page\/2, 2014.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5927\" data-id=\"5927\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/capitulo-de-livros\/multilevel-reliability-simulation-for-ic-design\/\" title=\"MULTILEVEL RELIABILITY SIMULATION FOR IC DESIGN\">MULTILEVEL RELIABILITY SIMULATION FOR IC DESIGN<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>SUTARIA, K. B., VELAMALA, J. B. A., WIRTH, G. I., SATO, T., CAO, YU, , MULTILEVEL RELIABILITY SIMULATION FOR IC DESIGN. In: Bias Temperature Instability for Devices and Circuits, ISBN: 9781461479093, Springer. http:\/\/link.springer.com\/chapter\/10.1007%2F978-1-4614-7909-3_28, 2014.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><article class=\"eael-grid-post  eael-post-grid-column eael-pg-post-5924\" data-id=\"5924\">\n    <div class=\"eael-grid-post-holder\">\n        <div class=\"eael-grid-post-holder-inner\"><div class=\"eael-entry-wrapper\"><header class=\"eael-entry-header\"><h2 class=\"eael-entry-title\"><a class=\"eael-grid-post-link\" href=\"https:\/\/www.ufrgs.br\/ppgee\/capitulo-de-livros\/comparative-analysis-of-mobility-and-dopant-number-fluctuation-models-for-the-threshold-voltage-fluctuation-estimation-in-45-nm-channel-length-mosfet-device\/\" title=\"COMPARATIVE ANALYSIS OF MOBILITY AND DOPANT NUMBER FLUCTUATION MODELS FOR THE THRESHOLD VOLTAGE FLUCTUATION ESTIMATION IN 45 NM CHANNEL LENGTH MOSFET DEVICE\">COMPARATIVE ANALYSIS OF MOBILITY AND DOPANT NUMBER FLUCTUATION MODELS FOR THE THRESHOLD VOLTAGE FLUCTUATION ESTIMATION IN 45 NM CHANNEL LENGTH MOSFET DEVICE<\/a><\/h2><\/header><div class=\"eael-entry-content\">\n                                <div class=\"eael-grid-post-excerpt\"><p>VASILESKA, D., ASHRAF, N., WIRTH, G. I., SRINIVASAN, P., , COMPARATIVE ANALYSIS OF MOBILITY AND DOPANT NUMBER FLUCTUATION MODELS FOR THE THRESHOLD VOLTAGE FLUCTUATION ESTIMATION IN 45 NM CHANNEL LENGTH MOSFET DEVICE. In: Nanoelectronic Device Applications Handbook, ISBN: 9781466565234, CRC Press. http:\/\/www.crcpress.com\/product\/isbn\/9781466565234, 2013.<\/p><\/div>\n                            <\/div><div class=\"eael-entry-header-after style-two\"><div class=\"eael-entry-meta\"><\/div><\/div><\/div><\/div>\n    <\/div>\n<\/article><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-95e819d elementor-widget elementor-widget-heading\" data-id=\"95e819d\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Patentes<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-0911658 elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"0911658\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-0911658\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-0911658 eael-post-grid-style-two\" data-layout-mode=\"masonry\"><p class=\"no-posts-found\">Nenhum post encontrado!<\/p><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-af1bfa3 elementor-widget elementor-widget-heading\" data-id=\"af1bfa3\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Registro de Software<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-9ec9947 elementor-grid-eael-col-1 elementor-grid-tablet-eael-col-2 elementor-grid-mobile-eael-col-1 elementor-widget elementor-widget-eael-post-grid\" data-id=\"9ec9947\" data-element_type=\"widget\" data-e-type=\"widget\" data-settings=\"{&quot;eael_post_grid_columns&quot;:&quot;eael-col-1&quot;,&quot;eael_post_grid_columns_tablet&quot;:&quot;eael-col-2&quot;,&quot;eael_post_grid_columns_mobile&quot;:&quot;eael-col-1&quot;}\" data-widget_type=\"eael-post-grid.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div id=\"eael-post-grid-9ec9947\" class=\"eael-post-grid-container\">\n            <div class=\"eael-post-grid eael-post-appender eael-post-appender-9ec9947 eael-post-grid-style-two\" data-layout-mode=\"masonry\"><p class=\"no-posts-found\">Nenhum post encontrado!<\/p><\/div>\n            <div class=\"clearfix\"><\/div>\n        <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"featured_media":1542,"template":"elementor_header_footer","docente":[],"class_list":["post-4824","professor","type-professor","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/professor\/4824","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/professor"}],"about":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/types\/professor"}],"version-history":[{"count":0,"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/professor\/4824\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/media\/1542"}],"wp:attachment":[{"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/media?parent=4824"}],"wp:term":[{"taxonomy":"docente","embeddable":true,"href":"https:\/\/www.ufrgs.br\/ppgee\/wp-json\/wp\/v2\/docente?post=4824"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}