Program


Program Schedule is in Brasilia time (GMT-3), for other countries please check https://www.thetimezoneconverter.com
December 1, 2020
HorárioPalestrante
9:30-10:00Opening Session
10:00-11:00Joaquim E. R. Costa - The Effect of Space Weather on the Space Assets
INPE (National Institute of Space Research, Brazil)
Abstract & Short Bio
11:00-12:00José Ramón GONZÁLEZ - Effects of Radiation on Multijunction Solar Cells for Space Application
European Space Agency, The Netherlands
Abstract & Short Bio
13:30-14:30Stephen Buchner - Single Event Effects
Naval Research Laboratory, Washington DC, USA
Abstract & Short Bio
14:30-15:30Luca Sterpone - SEE effects on VLSI devices: challenges and solutions
Politecnico de Torino, Italy
Abstract & Short Bio
15:30-16:30Ricardo Reis - Circuit Level Design Methods to Mitigate Soft Errors
UFRGS
Abstract & Short Bio


December 2, 2020
HorárioPalestrante
9:00-10:00Pavel Chubunov - SEE test methods
URSC-ISDE, Russia
Abstract & Short Bio
10:00-11:00Raoul Velazco - Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases
TIMA, France
Abstract & Short Bio
11:00-12:00Giuseppe Lerner - Accelerator radiation environment: modeling and monitoring tools and approaches
CERN, Switzerland
Abstract & Short Bio
13:30-14:30Marcilei Guazzelli da Silveira, Nilberto Heder Medina, Odair Lelis Gonçalez, Tiago Balen, Claudio Federio - Brazilian Facilities and Case-studies
FEI, Brazil / USP, Brazil / IEAv, CTA, Brazil / UFRGS, Brazil
Abstract & Short Bio
14:30-15:30Stephen Buchner - Hardness Assurance
Naval Research Laboratory, Washington DC, USA
Abstract & Short Bio
15:30-16:30Jonathan Pellish - Assurance Guidelines for Next-Generation Exploration Systems
NASA, USA
Abstract & Short Bio
16:30-17:30Melanie Berg - Characterizing FPGA Failure Probabilities for Critical Space Systems
Space R2 LLC, USA
Abstract & Short Bio


December 3, 2020
HorárioPalestrante
9:00-10:00Jaime Estela - COTS in Space: Qualified commercial components for space
Spectrum Aerospace Technologies, Munich, Germany
Abstract & Short Bio
10:00-11:00Michel Pignol, - System Hardening and Real Space Applications
CNES,France
Abstract & Short Bio
11:00-12:00Luis Alfonso Entrena Arrontes - Fault Injection and Formal Verification Methodologies
Universidad Carlos III de Madrid, Spain
Abstract & Short Bio
13:30-14:30José Lipovetzky - Ionizing radiation effects on CMOS image sensors
Centro Atómico Bariloche – CNEA, Argentina
Abstract & Short Bio
14:30-15:30Fernanda Lima Kastensmidt - Analyzing the Reliability of Neural Networks in Programmable SoC Devices
UFRGS, Brazil
Abstract & Short Bio
15:30-17:00POSTER SESSION

December 4√, 2020
HorárioPalestrante
9:00-10:00Sung Chung, - Radiation Test Requirements for Functional Safety Standards
QRT, South Korea
Abstract & Short Bio
10:00-11:00Juan A. Clemente - Analyzing data extracted from radiation tests in advanced SRAMs
Universidad Complutense de Madrid, Spain
Abstract & Short Bio
11:00-12:00Yann Deval - Transistor- and System-Level Approaches for Hardened-by-Design Silicon Integrated Circuits in Harsh Radiation Environments
IMS, University of Bordeaux, France
Abstract & Short Bio
13:30-14:30Juan A. Fraire - Routing in Fault-Prone Delay-Tolerant Networks
Universidad Nacional de Córdoba, Argentina and Universität Des Saarlandes, Germany
Abstract & Short Bio
14:30-15:30João Baptista Martins and Nelson Jorge Schuch - NanosatC-Br Program and Development of Radiation Hardened Integrated Circuits for Satellites Applications
UFSM / INPE, SM, Brazil
Abstract & Short Bio
15:30-16:30Paolo Rech and José Rodrigo Azambuja - Radiation Effects and Mitigation Techniques in GPU
UFRGS, Brazil
Abstract & Short Bio
16:30-17:00Closing Session





Joaquim E. R. Costa - INPE (National Institute of Space Research, Brazil)
The Effect of Space Weather on the Space Assets

Abstract:
The Space Weather Division of the National Institute for Space Research (INPE) is running the Brazilian Regional Warning Center for Space Weather program (named EMBRACE). The center studies events from their initiation on the sun to their impacts on the earth, including their effects on space-based and ground-based technological systems. The program builds on the existing capabilities at INPE, which include scientists with a long tradition and excellence in the observation, analysis and modelling of solar and solar-terrestrial phenomena and an array of ground-based instruments that spans all over Brazil from the north to south of the magnetic dip equator.


Short Bio:
PhD in Astrophysics by the National Institute for Space Research – INPE. Senior researcher at Astrophysics Division/INPE. He has experience in Astronomy, with emphasis on Heliophysics, acting on the following topics: Modeling of solar flares with diagnoses in various wavelengths in complex inhomogeneous environments, analysis in radio of the quiescent solar atmosphere, predictive modelling in space weather, instrumentation in radio astronomy and modelling of magnetic cataclysmic variables. He is currently Head of Space Weather Division that runs the EMBRACE-program (Brazilian Studies and Monitoring Space Weather) of the National Institute for Space Research.



José Ramón GONZÁLEZ - European Space Agency, The Netherlands
Effects of Radiation on Multijunction Solar Cells for Space Application

Abstract:


Short Bio:
José Ramón González, obtained his PhD. in Physics from the Polytechnic University in Madrid, specialised in Photovoltaic Solar Energy. Since 2013, he is been working for the European Space Agency, in ESTEC, The Netherlands.



Stephen Buchner - Naval Research Laboratory, Washington DC, USA
Single Event Effects

Abstract:
The program touches on a number of topics of foci for our space weather technological assets, including defining a pathway of solar-terrestrial physics, especially to pure science and, with ICAO / WMO, its training for "next-generation of environmental services”, also following Best Practices provided by WMO partners within the aviation sector or among other UN and ISES discussion’s groups for delivering improved international space weather services upon which I will introduce to you.


Short Bio:
Dr. Buchner has been working in the field of radiation effects for the past 40 years. He has been involved in all aspects of radiation effects, including single-event effects, displacement damage, and total ionizing dose. He has used that information to evaluate the radiation sensitivity of parts used in several space missions.
Dr. Buchner received the B.A. degree (physics) from Princeton University and the PhD degree from the University of Pennsylvania (physics). He has worked for Martin Marietta Laboratories, NASA Goddard Space Flight Center, and the U.S. Naval Research Laboratory.



Luca Sterpone - Politecnico de Torino, Italy
SEE effects on VLSI devices: challenges and solutions

Abstract:
Radiation effects on VLSI technology are provoked when radiation particles such as neutrons, protons or heavy ions hit a sensitive region of the integrated circuits. Due to the progressive technology scaling, VLSI devices are becoming, more and more vulnerable to Single Event Effects (SEEs) and are subject to cumulative ionizing damage known as Total Ionization Dose (TID). This talk will firstly describe the state-of-the-art methodologies used for analysing the impact of radiation effects on modern FPGAs and ASICs by means of Computer Aided Design (CAD) tools and secondly, it will describe the state-of-the-art CAD design techniques for their mitigation.


Short Bio:
Luca Sterpone received the MS and PhD degrees in computer
engineering from Politecnico di Torino, Italy, in 2003 and
2007, respectively. He is currently an associate professor with
the Department of Computer Engineering, Politecnico di
Torino. His current research interests include reconfigurable
computing, computer-aided design algorithms, fault tolerance
architectures and radiation effects on components and systems.
He is author of more than 160 papers and he received several
awards for his research activities



Ricardo Reis - UFRGS
Circuit Level Design Methods to Mitigate Soft Errors

Abstract:
The mitigation of soft errors (SE) should be considered in all design abstraction levels, from a high-level to the physical one. This talk will discuss the efficiency of mitigation techniques to decrease the soft error susceptibility on the circuit/physical design levels considering a 7-nm FinFET technology. Simulations were performed at nominal and near-threshold operations. The transistor reordering putting the serial transistors as far as possible to the output is not favorable to mitigate the soft error susceptibility. For example, the AOI21 cell is 20% more robust to soft errors if the standard version is kept in the design. The gains of this technique are more significant for lower LETs. The logic multi-level design improves over 45% on average the SET results for the cells evaluated. The LETth considering the work-function fluctuation (WFF) impact is smaller than the LETth at ideal conditions. That is, due to WFF, a smaller amount of energy transferred by the particle is required to cause a disturbance in the circuit. When decoupling cells are adopted in the design, the soft error susceptibility decreases around 24.5%, 23.7%, and 11.4% for LETs equal to 15, 20, and 58MeV.cm2.mg-1, respectively, in our test cases. Although the design of FinFET gates connecting decoupling cells in the output is better to improve the SE susceptibility, larger SET pulses were verified mainly under higher LET levels. The results show that a design using a sleep transistor or Schmitt Trigger is very promising for soft error mitigation. The three logic cells evaluated become free of faults (no events seen at gate output) using these techniques, independently of the LET, input vector, or core voltage employed in the design.


Short Bio:
Ricardo Reis received a Bachelor degree in Electrical Engineering from Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, in 1978, and a Ph.D. degree in Microelectronics from the National Polytechnic Institute of Grenoble (INPG), France, in 1983. Doctor Honoris Causa by the University of Montpellier in 2016. He is a full professor at the Informatics Institute of Federal University of Rio Grande do Sul. His main research includes physical design automation, design methodologies, fault tolerant systems and microelectronics education. He has more than 600 publications including books, journals and conference proceedings. He was vice-president of IFIP (International Federation for Information Processing) and he was also president of the Brazilian Computer Society (two terms) and vice-president of the Brazilian Microelectronics Society. He is an active member of CASS and he received the 2015 IEEE CASS Meritorious Service Award. He was vice-president of CASS for two terms (2008/2011), representing R9. He is the founder of the Rio Grande do Sul CAS Chapter, which got the World CASS Chapter of The Year Award 2011 and 2012, and R9 Chapter of The Year 2013, 2014, 2016 and 2017. He is a founder of several conferences like SBCCI and LASCAS, the CASS Flagship Conference in Region 9. He was the General or Program Chair of several conferences like IEEE ISVLSI, SBCCI, IFIP VLSI-SoC, ICECS, PATMOS. Ricardo was the Chair of the IFIP/IEEE VLSI-SoC Steering Committee, vice-chair of the IFIP WG10.5 and he is Chair of IFIP TC10. He also started with the EMicro, an annually microelectronics school in South Brazil. In 2002 he received the Researcher of the Year Award in the state of Rio Grande do Sul. He is a founding member of the SBC (Brazilian Computer Society) and also founding member of SBMicro (Brazilian Microelectronics Society).



Pavel Chubunov - URSC-ISDE, Russia
SEE test methods

Abstract:
This talk provides basic information on principles, methods and equipment for single event effects (SEE) testing of electronic components. A description of the various possibilities for SEE testing, the requirements for testing with heavy ions and protons are given. The features of testing under various conditions for all types of effects are described in detail. A typical sequence of preparation and carrying out of SEE tests are shown. Practical recommendations are given based on the real test experience. The presentation also tells about installations for providing SEE tests with the ions and protons such as particle accelerators and tools for monitoring beam parameters.


Short Bio:
Pavel Chubunov graduated from the Moscow Engineering Physics Institute (MEPhI) in 2006 as an engineer-physicist. After graduating from the university and up to the present time he works at the Institute of Space Device Engineering (ISDE), Moscow, Russia. Over the years, Pavel has gone through a career path from a research engineer to the head of a research and production complex in ISDE. Also since 2007 he has been giving classes for students of MEPhI. His professional interests include radiation testing of electronic components, radiation hardness assurance of space systems, test facilities based on various radiation sources, including heavy ion accelerators, semiconductor devices for monitoring ionizing radiation.



Raoul Velazco - TIMA, France
Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases

Abstract:
This presentation describes a method devoted to SEU error-rate prediction for processor-based architectures. The proposed method combines results issued from fault-injection, performed at circuit by means of CEU (Code Emulated Upsets), to those issued from radiation ground tests. It allows predicting error rates without requiring radiation ground-tests for future applications. The approach was successfully applied to processors and FPGAs and is illustrated by three representative case-studies.


Short Bio:
Dr. Raoul Velazco received the PhD and the Doctor in Computer Sciences titles in 1982 and 1990 respectively, both from INPG in Grenoble.
With the CNRS (French Research Agency) since 1984, where he is Emeritus since the end of 2019, he was the leader of RIS (Robust Integrated Systems) research group at TIMA laboratory (Grenoble, France). His main research activities focus the study of radiation effects on microelectronic circuits, the fault tolerance techniques at various levels (design, software, hardware...) and the development and exploitation of “real-life” experiments devoted to operate at high altitude and on board satellites.
He has supervised 21 PHDs and is author or co-author of more than 250 scientific publications. He was the general chair or program chair of many international conferences and symposiums: RADECS 2001 (Radiation and their Effects on Circuits and Systems), DFT 2004 (Defect and Fault Tolerance), EWRH 2004 (European Workshop on Radiation Hardening), IOLTS 2008 (International On-Line Testing Symposium), DECIDE 2008 (Dependable Circuits Design), DCIS 2008 (Design of Integrated Circuits and Systems), SEE 2009 (Single-Event Effects Symposium), LATS 2019 (Latin American Test Symposium).
In 2005 he was the co-founder of SERESSA (School on the Effects of Radiations on Embedded Systems for Space Applications) of which he is the general co-chair.



Giuseppe Lerner - CERN, Switzerland
Accelerator radiation environment: modeling and monitoring tools and approaches

Abstract:
The talk presents the key features of the radiation environment of high energy physics accelerators, focusing on the case of the 27 km long Large Hadron Collider (LHC) at CERN. The key R2E challenges are highlighted, and comparisons are drawn with other known cases such as space applications or avionics. The talk includes a description of how the radiation levels are measured and predicted in different areas of the LHC that host critical electronic systems, suffering from both cumulative damage (mostly related to Total Ionising Dose) and Single Event Effects (SEEs). Lastly, it describes a Radiation Hardness Assurance procedure currently in place for future electronic systems to be installed in the High Luminosity upgrade of the LHC (HL-LHC) starting from 2025.


Short Bio:
I am a senior fellow at CERN in the R2E project, working on the characterisation of the radiation environment generated by the largest particle accelerator in the world, the 27-km long Large Hadron Collider (LHC). Previously I have studied physics at the University of Milan, and I obtained a PhD at the University of Sussex (UK) working on the ATLAS experiment at CERN, searching for new physics beyond the Standard Model. My interests range from fundamental physics to applied nuclear physics and radiation-matter interaction, including radiation detectors and monitors and radiation-induced effects to electronics.



Marcilei Guazzelli da Silveira, Nilberto Heder Medina, Odair Lelis Gonçalez, Tiago Balen, Claudio Federio - FEI, Brazil / USP, Brazil / IEAv, CTA, Brazil / UFRGS, Brazil
Brazilian Facilities and Case-studies

Abstract:
This talk presents the main Brazilian facilities in which radiation tests of electronic systems can be performed: 1) The Ionizing Radiation Laboratory (LRI) from the Institute for Advanced Studies, in São José dos Campos – specialized in Cobalt-60 gamma irradiations and neutron tests; 2) The Laboratory of Ionizing Radiation Effects (LERI) from University Center FEI in São Bernardo do Campo – specialized in 10-keV X-ray testing; and 3) The Open Laboratory of Nuclear Physics from University of São Paulo (LAFN-USP) – with ion beams from protons to 107Ag produced by the São Paulo 8UD Pelletron Accelerator. Researchers of each institution will present the facilities, the available equipment and type of tests that may be performed. Finally, a case study, a mixed-signal system prototyped in a commercial programmable SoC, which was irradiated in all the three laboratories, is discussed, as an example from the standpoint of an user of the presented facilities.


Short Bio:
Tiago

Tiago Roberto Balen received his Electrical Engineering degree, MSc and PhD degrees from Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, in 2004, 2006, and 2010, respectively. In 2012, he received an important award from FAPERGS (Rio Grande do Sul State Research Fomentation Agency) for the innovative contributions of his PhD thesis. His research interests include analog and mixed-signal test, built-in-self test, programmable analog devices, fault tolerant circuits and radiation effects on electronic systems. He has published more than 50 papers on these topics in important conferences and journals, receiving two “Best Paper Awards” for his contributions. Currently, he is associate professor at the Electrical Engineering department and head of the graduate program on Microelectronics (PGMICRO) of the Federal University of Rio Grande do Sul (UFRGS).


Odair

Odair L. Gonçalez received his B.S. in Physics from São Paulo University, São Paulo, Brazil, in 1978, the M.S. in Nuclear Physics from Technological Institute of Aeronautics, São José dos Campos, Brazil, in 1982, and the Ph.D degree in Applied Nuclear Technology, also, from São Paulo University, in 1998. He is a senior researcher at the Institute of Advanced Studies of the Brazilian Air Force Command, in São José dos Campos, Brazil, since 1979 and, also, professor of the graduate course in Space Sciences and Technologies at the Technological Institute of Aeronautics, since 2012. His research interests include atmospheric cosmic radiation and its effects on crews, aerospace dosimetry and radiation protection, radiation effects on electronic devices and radiation tests.


Medina

Nilberto H. Medina graduated in Physics (1984), received his MS (1988) and PhD (1992) from Universidade de São Paulo, Brazil. Postdoctoral fellowship (1993-1995) at the Legnaro National Laboratories, Legnaro, Italy. Now he is Associate Professor in Universidade de São Paulo and addressed 4 doctoral theses and 6 master´s dissertations. His main research topics are Nuclear Structure via gamma-ray spectroscopy, Nuclear Instrumentation and Radiation Effects in Electronic Devices. Prof. Medina published more than 170 papers in Nuclear Physics and Applied Nuclear Physics.


Marcilei

Marcilei Aparecida Guazzelli is a full professor at the FEI University Center having completed her bachelor's degree in physics in 1994 from the Institute of Physics at University of São Paulo (IFUSP), her master's degree in 1999 and her doctorate in physics in 2004, also at IFUSP. Performed postdoctoral internship at the National Institute of Nuclear Physics, Italy. She completed a postdoctoral degree in 2006 at USP, where she is a collaborating researcher. Coordinates the Laboratory of Radiation Physics - LAFIR - supported by FAPESP, where projects are developed for the study of Natural Radiation and elemental composition. Participates in research projects on nuclear techniques used in analysis and characterization of materials. Works in Basic Nuclear Physics, Applied Nuclear Physics and Material Science. She participates as a researcher in a thematic project "Nuclear reactions with weakly connected centers or with cluster structure, radioactives and stable" (FAPESP). Coordinates also the Ionizing Radiation Effects Laboratory - LERI - at FEI University Center. Participates in several projects related to strategic areas for Brazil (aerospace and defense), aiming at tests for characterization and qualification of electronic devices tolerant to ionizing radiation. She is the local coordinator of the CITAR - Radiation Tolerant Integrated Circuits project with support from FINEP. She studies about methodology of radiation testing on electronic devices for the effect of Total Ionizing Dose and conducts tolerance experiments for Single Event Effect using the Pelletron Particle Accelerator (IFUSP). Coordinates locally the INCT Nuclear Physics and Applications project at the FEI University Center and participates in an European project - NUMEN, Italy - for double beta decay verification and testing of the electronic equipment used to acquire data from the accelerator of Laboratori Nazionali del Sud, Catania, Italy. She has regular publications in the area of ​​Radiation Physics, developing environmental and sustainability work in the area of ​​Natural Radiation, analysis of TENORM materials and Effects of Ionizing Radiation on Electronic Devices.



Stephen Buchner - Naval Research Laboratory, Washington DC, USA
Hardness Assurance

Abstract:
In this course, I will discuss the steps taken for selecting parts for a space mission based on their radiation response. The discussion will emphasize that the radiation levels depend on the mission goals and the levels of acceptable risk.


Short Bio:
Dr. Buchner has been working in the field of radiation effects for the past 40 years. He has been involved in all aspects of radiation effects, including single-event effects, displacement damage, and total ionizing dose. He has used that information to evaluate the radiation sensitivity of parts used in several space missions.
Dr. Buchner received the B.A. degree (physics) from Princeton University and the PhD degree from the University of Pennsylvania (physics). He has worked for Martin Marietta Laboratories, NASA Goddard Space Flight Center, and the U.S. Naval Research Laboratory.



Jonathan Pellish - NASA, USA
Assurance Guidelines for Next-Generation Exploration Systems

Abstract:
As human and robotic exploration missions continue to push humanity’s technological boundaries, well-aligned radiation hardness assurance (RHA) practices for electrical, electronic, electromechanical, and electro-optical (EEEE) components are more important than ever – especially with requirements that necessitate accelerated use of commercial off the shelf (COTS) products. While other talks in this year’s SERESSA offering will focus on general RHA approaches, this presentation will focus specifically on a number of current topics that are bridging the gaps between state-of-the-art and state-of-the-practice concerning total ionizing dose, total non-ionizing dose, and single-event effects.


Short Bio:
Jonathan “Jonny” Pellish is employed at the Goddard Space Flight Center as the National Aeronautics and Space Administration’s Electronic Parts Manager, responsible for workforce development and stewardship as well as coordinating Agency-wide technical activities in the electronic parts and radiation effects engineering communities. Jonny is also the deputy manager for the NASA Electronic Parts and Packaging (NEPP) Program, which is operated by NASA Goddard for the NASA Office of Safety and Mission Assurance.



Melanie Berg - Space R2 LLC, USA
Characterizing FPGA Failure Probabilities for Critical Space Systems

Abstract:
Predicting the reliability of critical space applications requires analyzing susceptibilities to environmental ionization effects. Susceptibility data (in the form of single event cross sections (σ)) are obtained by performing heavy-ion experiments. In turn, empirical σ-data are used to derive reliability/survivability characterization and predictive failure-rates. Because FPGA devices are vital microelectronic components that control Mil/Aero critical applications, characterization of FPGA ionization susceptibilities and potential mission impact is essential.
The scope of this presentation targets FPGA reliability/survivability characterization for Mil/Aero missions. The following topics will be covered:
• σ definitions and usage (e.g., generic characterization versus tactical-application prediction)
• σ extrapolation to tactical systems
• Correlation of σ-data to classical reliability (probability theory) with use of fluence-to-time domain transformations
• Convolution of σ-data with natural space environment data for survivability/reliability characterizations and failure-rate predictions


Short Bio:
Ms. Melanie Berg has 32-years of experience as a designer, verification engineer, instructor, and reviewer for a variety of high-speed multi-million gate ASIC and FPGA development teams. Her more visible accomplishments are her contributions to design and V&V in the NASA sponsored New Horizons Pluto and Beyond Mission; and her research/development in the field of FPGA/ASIC radiation effects and mitigation strategies. For over 16-years, Ms. Berg has been a member of the Radiation Effects and Analysis group at NASA Goddard Space Flight Center (GSFC). Regarding cyber-security and Trust, Ms. Berg is a major contributor towards the development of a novel assurance framework for the Defense Production Act Title III effort. Ms. Berg has published and presented several papers concerning such topics as: ionization and microelectronic error-response characterization, reliable synchronous design methodology, robust verification techniques, mitigation strategies for critical circuitry, reliability/survivability prediction calculations, hardness assurance for space flight systems, and ASIC/FPGA Trust/Security schemes. Ms. Berg has founded Space R2 LLC (an ASIC/FPGA design and assurance company) supporting the United States DoD, DoE, and the Space industry in radiation effects and cyber security.



Jaime Estela - Spectrum Aerospace Technologies, Munich, Germany
COTS in Space: Qualified commercial components for space

Abstract:
Commercial electronics compared to their space qualified counterparts are increasingly proving to be fit for use in space. High performance and reliability together with reduction of qualification costs and less testing time play an important role in the development of the space market. Space-COTS are commercial components qualified for small satellite missions, which support the NewSpace technology development.


Short Bio:
Mr. Jaime Estela is an electronic engineer born in Lima-Peru. He worked at the German Space Operations Center of DLR in Oberpfaffenhofen for 11 years. In this period he gathered experience in satellite operations and systems engineering and supported several LEO orbit satellite missions like Terrasar-X, Tandem-X, Prisma A & B, Grace 1 & 2, CHAMP, BIRD, TET and was also involved, as Ground Segment Engineer, in the ESA project Columbus, space laboratory onboard the ISS,.
Furthermore he has supported CubeSat projects developed by Universities. He supported the project QB-50, an international constellation of 50 CubeSats which will study the higher ionosphere in a low Earth orbit and during its reentry as suborbital research platform.
Space-COTS are commercial components qualified for space applications using an efficient method and was invented by Mr. Estela. Space-COTS represent the middle point between having no qualified components in opposition to a fully qualified EEE parts.
Mr. Estela is a supporter of the NewSpace initiative and contributes to this space movement actively with new concepts, ideas, products and services.



Michel Pignol, - CNES,France
System Hardening and Real Space Applications

Abstract:
This talk describes the suitable protection at architecture and system level against the effects of radiation on electronic components and digital systems.

After the description of the general architecture of a space avionics system, the potential solutions for each type of units constituting an on-board computer are presented through the example of real space applications: avionics bus, links, memory units, and – the main part – processing units i.e. fault-tolerant architectures.


Short Bio:

Michel PIGNOL was born in Clermont-Ferrand, France, in January 1960. He received an Engineering degree in Electronics from Polytech'Clermont-Ferrand, France, in 1983 and a Ph.D. in Electronics from the Blaise Pascal University of Clermont-Ferrand, France, in 1986.



He worked for SAGEM, Eragny, France, where he was in charge of military and space embedded computers for 5 years. He has been working for CNES, the French Space Agency, since 1990 where he has been in charge of R&D studies and program developments on on-board data computers and high speed links. He is author of several corporate patents concerning fault-tolerant architectures well suited to space applications, memory protections and very high speed data links. He is involved in standardisation working groups, Program Committees for international conferences / journals, and international schools.



Luis Alfonso Entrena Arrontes - Universidad Carlos III de Madrid, Spain
Fault Injection and Formal Verification Methodologies

Abstract:
Fault injection is a widely used method to evaluate fault effects and error mitigation in a design. While not a replacement for standard Radiation-Hardness Assurance methodologies, it can provide valuable information in a quick and inexpensive manner. Moreover, recent developments have improved performance by several orders of magnitude, thus enabling the realization of extremely large fault injection campaigns. Today, fault injection can be used to forecast the expected circuit behavior in the occurrence of SEUs and SETs and detect weak areas that require error mitigation. However, fault injection is not exhaustive. Thus, formal verification methods are needed to ensure that the design has no mitigation leaks. This talk will review the most relevant fault injection methods, covering software-based techniques, simulation techniques and FPGA-based emulation techniques. Finally, formal verification techniques will also be introduced.


Short Bio:
Luis Entrena received the Industrial Engineering degree from Universidad de Valladolid (Spain) in 1988 and the PhD degree in Electronic Engineering from Universidad Politécnica de Madrid (Spain) in 1995. From 1990 to 1993 he was with AT&T Microelectronics at Bell Labs (USA). From 1993 to 1996 he was Technical Project Leader at TGI (Spain). In 1996 he joined Universidad Carlos III de Madrid (Spain), where he is currently Full Professor and has previously served as Head of the Electronic Technology Department and Director of the Postgraduate Program in Electrical Engineering. He has co-authored over 160 papers in international journals and conferences and holds a patent for the invention of the Redundancy Addition and Removal synthesis method. He has collaborated with industry in many projects and missions involving the use of FPGAs. His current research interest include sensitivity evaluation and mitigation of radiation effects in FPGAs, microprocessors and SoCs, fault injection and formal verification of hardened designs.



José Lipovetzky - Centro Atómico Bariloche – CNEA, Argentina
Ionizing radiation effects on CMOS image sensors

Abstract:
CMOS image sensors can be affected by ionizing radiation by several mechanisms. We will give an introduction to the operation of the devices, discuss Total Ionizing Dose and Displacement Damage effects on the sensors, mitigation techniques and briefly how the sensors can be used as particle detectors.


Short Bio:
He received the degree in Electronic Engineering and PhD in Engineering at the University of Buenos Aires in 2005 and 2010 respectively. Between 2010 and 2013 He worked as a Professor at the University of Buenos Aires, since 2012 as researcher at CONICET and since 2014 I work at the Centro Atómico Bariloche, CNEA. His topics of interest are ionizing radiation effects on CMOS circuits, radiation detection using different integrated devices and CMOS image sensors.



Fernanda Lima Kastensmidt - UFRGS, Brazil
Analyzing the Reliability of Neural Networks in Programmable SoC Devices

Abstract:
State-of-the-art programmable logic devices, known as Field Programmable Gate Array (FPGA) devices, include not only the programmable logic fabric but also hard-core parts, such as general-purpose processors, dedicated processing blocks, interfaces to various peripherals, on-chip bus structures, and analog blocks. These new devices are commonly called All Programmable System-on-Chip (APSoC) devices. APSoC devices have large amount of computational resources available which make them very attractive to artificial intelligence applications embedded in vehicles. Applications based on image recognition, route prediction and classification are some example of real-time applications that can use neural networks embedded in SRAM-based FPGAs. Single Event Effects (SEE) are radiation-induced soft errors caused by ionized particles originated from the space environment or from neutron interaction with matter at ground level. A Single Event Upset (SEU) occurs when an SEE provokes a bit-flip in a memory element. SRAM-based Field Programmable Gate Arrays (FPGA) or APSoC are particularly susceptible to SEUs due to the millions of SRAM cells used to configure all the synthesized logic. Therefore, safety-critical systems making use of neural networks synthesized on APSoC must be characterized for SEE susceptibility and must have fault-tolerant mechanisms to protect not only the data but also the circuitry. There is a huge solution space to explore in neural networks into SoC: accuracy, reliability, time, power and area. The talk will explore some of these solutions by given case-study examples.


Short Bio:
Fernanda Kastensmidt holds a degree in Electrical Engineering from the Federal University of Rio Grande do Sul (1997), a master's degree in Computer Science from the Federal University
of Rio Grande do Sul (1999) and a doctorate in Computer Science from the Federal University of Rio Grande do Sul (2003). He is currently Associate Professor at the Federal University of Rio Grande do Sul and Coordinator of the Graduate Program in Microelectronics (PGMICRO). She has experience in Microelectronics and Computer Engineering, focusing on Hardware, acting on the following subjects: radiation fault protection techniques, fault tolerant systems design, programmable architecture, FPGA, systems qualification and fault integrated circuits and fault modeling. She is the author of the book Fault Tolerance Techniques for SRAM-based FPGAs published in 2006 by Springer and co-author of 3 more scientific books. Participated in the NanoSat-BR1 satellite payload project which was launched in June 2014 and is currently in the NanoSat-BR2 project where part of the payload is responsible for analyzing the effects of SAA on Integrated Circuits manufactured using nanometer technology.



Sung Chung, - QRT, South Korea
Radiation Test Requirements for Functional Safety Standards

Abstract:
The presentation brings 4 key points to address status of various standards requiring radiation test, how the data is analyzed and used, how the industry is preparing for the changes. As an expert in the field of radiation test and analysis what and how can we help the industry to achieve safety goals and deliver reliable products to the end users.
1. Status of various standards requiring radiation test for commercial application
2. How the SER data is used and applied
3. How the industry is preparing for the changes
4. What and how can we help the businesses and the consumers
5. Conclusions


Short Bio:
Sung Soo Chung (IEEE Life Member since 2018) spent 15+ years with Cisco Systems Inc., where he managed ASIC DFT Team for over 10 years. and Mr. Chung also developed industry first companywide SEU test and mitigation processes to mitigate radiation induced soft errors.
He briefly joined Hanyang University as a Research Professor from July 2013 to July 2016, lecturing and researching as a part of Korean Government’s Brain Scouting Program and Sung is now with QRT Inc to lead R&D activities for radiation induced soft error test and analysis.
He holds 17 U.S. and Korean patents and has contributed over 40+ technical papers in ASIC test, Design-for-Test, Soft Error test & mitigation, and fault injection techniques.



Juan A. Clemente - Universidad Complutense de Madrid, Spain
Analyzing data extracted from radiation tests in advanced SRAMs

Abstract:
When researchers perform experiments on advanced SRAMs in order to assess their sensitivity against radiation, it is important to correctly classify the observed errors according to their multiplicity (Single Bit Upsets (SBUs), Multiple Cell Upsets (MCUs), etc). However, this might become a challenge in modern devices that implement mechanisms to detect and correct such errors (bit interleaving and Error Correcting Codes (ECC), amongst others). The reason is that this information is usually intellectual property (IP) of the manufacturers. In this talk we will discuss how this problem can be solved, even if said proprietary information is unknown to researchers. In addition, we will discuss the impact of error accumulation in experiments where too many bitflips are observed (due to a high particle flux, for example), and why the probability of observed so-called "false multiple events" is not negligible.


Short Bio:
Juan A. Clemente received his degree in computer science and his Ph.D. degree from Universidad Complutense de Madrid (UCM), Madrid, Spain, in 2007 and 2011, respectively. He is an Assistant Professor with the Computer Architecture Department, UCM, and a Researcher with the GHADIR Research Group. His research interests include the study of single-event effects tolerance of digital circuits, especially commercial-off-the-shelf memories, and their use in harsh environments, such as space. For conducting this research, he collaborates with the TIMA Laboratory, Grenoble-Alpes university, Grenoble, France, and with the ONERA (the French Aerospace Lab), Toulouse, France.



Yann Deval - IMS, University of Bordeaux, France
Transistor- and System-Level Approaches for Hardened-by-Design Silicon Integrated Circuits in Harsh Radiation Environments

Abstract:
This talk discusses some design tips that allow a significant reduction in the sensitivity of integrated circuits to the effects of ionizing radiation. Analog and digital circuits in silicon technologies (MOS and bipolar) are addressed here. Examples of hardening-by-design for total ionizing dose (cumulative) effect, single event effects, and high dose (instantaneous) effects are discussed.
Redundancy, specific topology, system-level compensation, detour of induced currents: any combination of these design approaches is useful as long as it avoids the implementation of a specific - and therefore hugely expensive - radiation-hardened technology. Not to mention, using standard silicon technologies allows the use of advanced building blocks from an up-to-date cell library. It paves the way for the design of high-efficiency integrated circuits, which unfortunately cannot be achieved with natively radiation-hardened technologies.


Short Bio:
Prof. Yann DEVAL joined the University of Bordeaux in the Southwest of France in 1993, as an Assistant Professor, focusing on the design of analog ICs, RFICs, high-speed mixed-signal ICs, and high-reliability electronics. He pursues his researches within the IMS, the laboratory of Integration, from Material to System. In 1999 Dr. Deval became an Associate Professor and, in 2004, a Full Professor. From 2006 to 2010 he was the head of the IC design Group, and from 2011 to 2016 the head of the Devices, Circuits, and Systems (DCS) Department. Since 2016, Dr. Deval is the director of IMS. This public research laboratory is composed of 150 Ph.D. students and 150 faculties, with the support of roughly 100 technicians, engineers, and admin assistants.



Juan A. Fraire - Universidad Nacional de Córdoba, Argentina and Universität Des Saarlandes, Germany
Routing in Fault-Prone Delay-Tolerant Networks

Abstract:
Internet-based communications have profoundly affected day to day life on Earth, and nothing seems to impede the exploitation of its advantages in near Earth constellations, deep-space missions, and beyond. However, delay (provoked by signal propagation) and disruption (provoked by planet occlusion or platforms and energy constraints) are the rule in space networking. Thus, the underlying protocols for the future space Internet rely on the Delay and Disruption Tolerant Networking (DTN) paradigm, where instantaneous feedback can no longer be assumed. In this talk we argue that by being delay-tolerant, the DTN architecture exhibits an intrinsic fault-tolerant feature. However, fault events need to be properly modeled and considered in the end-to-end DTN routing approach. After revising relevant missions in the domain, we discuss how recent research have treated transient faults as another case of disruptions in DTN. Nonetheless, while disruptions provoked by orbital mechanics are deterministic, transient faults exhibit a probabilistic behavior, and thus, require a different modeling approach at the routing level. Appropriate modeling based on Markov Decision Processes is presented and considered in the context of DTN routing decisions, to finally highlight opportunities and open research issues in the domain.


Short Bio:
Juan A. Fraire Juan A. Fraire (IEEE Member) is an assistant researcher at the National Research Council of Argentina (CONICET) and an associate professor at Universidad Nacional de Córdoba (UNC, FAMAF), Saarland University in Germany and guest professor at Politecnico di Torino in Italy. His research focuses on spaceborne networking and distributed applications enabled by state-of-the-art informatics techniques. Juan is the founder and chair of the annual Space-Terrestrial Internetworking Workshop (STINT) since 2014, has co-authored more than 50 papers published in international journals and leading conferences, and has imprinted a novel networking vision in his “Delay-Tolerant Satellite Network” book. Juan participates in joint projects with NASA’s Jet Propulsion Laboratory (JPL) and the Argentinian Space Agency (CONAE) and collaborates with world-renowned space companies and start-ups such as Skyloom (USA), GomSpace (Denmark), D3TN (Germany), and Orbitare (Switzerland).



João Baptista Martins and Nelson Jorge Schuch - UFSM / INPE, SM, Brazil
NanosatC-Br Program and Development of Radiation Hardened Integrated Circuits for Satellites Applications

Abstract:
This presentation discusses the NANOSATC-BR Program’s Missions as well as relevant researches related to the development of payloads on small satellites conducted by students and professionals until nowadays. The work exposes the current status of the Program’s CubeSats, NANOSATC-BR1 or NCBR1, (1U) and NANOSATC-BR2 or NCBR2, (2U), focusing mainly on its technological missions. The NANOSATC-BR1 was launched by a DNEPR launcher, at the Yasny Launching Base, in Russia, on June 19th, 2014. The NANOSATC-BR2 launching is currently scheduled for the first quarter of 2021, from a Russian base yet to be determined. The INPE-UFSM’s Capacity Building Program has the involvement of UFSM’s undergraduate students, graduate students from other institutions, and the participation of INPE/MCTI’s graduate students that develop activities in the Onboard Data Handling (OBDH) subsystem, Verification, Validation and Integration Testing for the NANOSATC-BR2. Students do the entire operation of the two NANOSATC-BR spacecraft through the use of Ground Stations (GS) with VHF/UHF bands antennas. For the future, it is intended that the launch of more two NANOSATC-BR satellites (3 and 4) will provide Brazil the very first CubeSats constellation. The Program has financial support from the Brazilian Space Agency (AEB) and from the Brazilian Ministry of Science, Technology and Innovation - MCTI. Also covered in this presentation is the development of two libraries of radiation hardened integrated circuits using RHBD techniques. These libraries were prototyped in silicon and are payloads of the NCBR1 and NCBR2 nanosatellites.


Short Bio:
Nelson Jorge Schuch - December-1972 - Graduated in Physics by The Federal University of Santa Maria - UFSM, Brazil. June-1975 - Master of Science in Astrophysics by The Mackenzie University, Brazil. November-1980 - Ph.D. and October-1980 - Senior Research - Post Doctor in Physics - Astrophysics by The University of Cambridge, England. Mentor of the actions for the development and construction of the INPE's Southern Regional Space Research Center - COESU/INPE-MCTI, in Santa Maria, RS, and The Southern Space Observatory - OES/COESU/INPE-MCTI, in São Martinho da Serrra, RS, and The Atmosphere and Ionosphere Observatory - OAI/COESU/INPE-MCTI, in Pains - Santa Maria, RS, in Southern Brazil. Mentor and the Coordinator of the NANOSATC-BR, CubeSats Development Program, and the NANOSATC-BR1 & NANOSATC-BR2 Projects Manager. Currently is an active Senior Researcher at COESU/INPE/MCTI, Santa Maria, RS, Brazil.


João Baptista dos Santos Martins holds the Electrical Engineering degree from UFSM (1984), Master in Electrical Engineering from UFSM (1993) and PhD in Computer Science from UFRGS (2001), in the area of microelectronics. Post-Doctor at the Institute of Engineering and Computer Systems, Research in Lisbon (INESC-ID) (2015). Full Professor of DELC / UFSM, leader of GMICRO / UFSM and General Coordinator of SMDH. With experience in the areas of Electrical and Computer Engineering, with an emphasis on Hardware, working mainly on the following topics: microelectronics, FPGA, VHDL, Low Power, Microcontrollers, Design of Radiation Hardened Integrated Circuits. Coordinator of the "BRAFISAT Project - Brazil-France Cooperation for the Training of Engineers in the Areas of Exploration of Micro and Nano Satellites" under the CAPES / BRAFITEC Program. Participates in SIS-ASTROS Project (Simulation System of ASTROS 2020 Project) in the Defense Area.



Paolo Rech and José Rodrigo Azambuja - UFRGS, Brazil
Radiation Effects and Mitigation Techniques in GPU

Abstract:
Parallel architectures such as Graphics Processing Units (GPUs), that are required to accelerate High-Performance Computing (HPC) applications and to detect objects in real- time safety-critical domains such as in self-driven vehicles, have been proved particularly vulnerable to transient faults. A neutron impact can generate faults in computing devices, leading to application crashes, wrong results, and system hangs. Several evidences showed that neutron-induced faults have corrupted large-server operations, have caused unexpected behaviors in airplanes, lead to car accidents, and have even influenced election results. In the talk we will briefly cover the effects of neutron impact on advanced computing systems, such as GPUs, and applications, such as convolutional neural networks for object detection. Particular emphasis will be given to self-driven cars, which is the newest trend in the automotive industry. We will present the results of several experiments on object-detection frameworks for automotive applications and show that neutrons can effectively change the way a vehicle senses objects, potentially leading to accidents. Finally, we will discuss if and how we can take advantage of the novel GPUs architectural solutions and software-based hardening techniques to improve application reliability without unnecessary overheads.


Short Bio:
Paolo Rech received his master and Ph.D. degrees from Padova University, Padova, Italy, in 2006 and 2009, respectively. He was then a Post Doc at LIRMM in Montpellier, France. Paolo is a Marie Curie Fellow at Politecnico di Torino, Italy, since 2012, he is an associate professor at UFRGS in Brazil, and he is the 2019 Rosen Scholar Fellow at the Los Alamos National Laboratory. His main research interests include the evaluation and mitigation of radiation-induced effects in large-scale HPC centers and in autonomous vehicles for automotive applications and space explorations.

Jose Rodrigo Azambuja received the MSc degree in computer sciences from the Universidade Federal do Rio Grande do Sul (UFRGS), Brazil, and the Ph.D. degree in computer sciences and electrical engineering from UFRGS and the Karlsruhe Institute of Technology, Germany. He is an Associate Professor at UFRGS since 2017, the Chair of the IEEE CASS-RS Chapter, and a member of the City Counsel for Science, Technology, and Innovation. His current research interests include reconfigurable computing, hardening techniques, and radiation effects on components and systems.



Committees

General Chair:
Ricardo Reis, UFRGS, Brazil
Raoul Velazco, TIMA, France
Program Chairs:
Fernanda Kastensmidt, UFRGS, Brazil
Pedro Martín-Holgado, CNA, Spain
Local Chairs:
Raphael Brum, UFRGS, Brazil
Tiago Balen, UFRGS, Brazil
Finance Chair:
Jose Rodrigo Azambuja, UFRGS, Brazil
Paulo Butzen, UFRGS, Brazil
Industry Liaisons
Joao Baptista, UFSM, Brazil
Marcelo Lubaszewski, UFRGS, Brazil
Poster Chairs:
Cristina Meinhardt, UFSC, Brazil
Alexandra Zimpeck, UCPel, Brazil
Web Chair:
Gabriel Souza Ribeiro

Past Events

Contact

Universidade Federal do Rio Grande do Sul
Instituto de Informática
Av. Bento Gonçalves, 9500
90650-001 - Porto Alegre, RS - Brazil

Copyright © 2020 SERESSA.