The Effect of Space Weather on the Space Assets

Joaquim E. R. Costa - INPE (National Institute of Space Research, Brazil)

Effects of Radiation on Multijunction Solar Cells for Space Application

José Ramón GONZÁLEZ - European Space Agency, The Netherlands

Single Event Effects

Stephen Buchner - Naval Research Laboratory, Washington DC, USA

SEE effects on VLSI devices: challenges and solutions

Luca Sterpone - Politecnico de Torino, Italy

Circuit Level Design Methods to Mitigate Soft Errors

Ricardo Reis - UFRGS, Brazil

Circuit Level Design Methods to Mitigate Soft Errors

Alexandra Zimpeck - UCPel

SEE test methods

Pavel Chubunov - URSC-ISDE, Russia

Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases

Raoul Velazco - TIMA, France

Accelerator radiation environment: modeling and monitoring tools and approaches

Giuseppe Lerner - CERN, Switzerland

Brazilian Facilities and Case-studies

Marcilei Guazzelli da Silveira - FEI, Brazil

Brazilian Facilities and Case-studies

Nilberto Heder Medina - USP, Brazil

Brazilian Facilities and Case-studies

Odair Lelis Gonçalez - IEAv, CTA, Brazil

Brazilian Facilities and Case-studies

Tiago Balen - UFRGS, Brazil

Hardness Assurance

Stephen Buchner - Naval Research Laboratory, Washington DC, USA

Assurance Guidelines for Next-Generation Exploration Systems

Jonathan Pellish - NASA, USA

Characterizing FPGA Failure Probabilities for Critical Space Systems

Melanie Berg - Space R2 LLC, USA

COTS in Space: Qualified commercial components for space

Jaime Estela - Spectrum Aerospace Technologies, Munich, Germany

System Hardening and Real Space Applications

Michel Pignol - CNES,France

Fault Injection and Formal Verification Methodologies

Luis Alfonso Entrena Arrontes - Universidad Carlos III de Madrid

Enhanced Observation Framework for embedded systems exposed to radiations

Fakhreddine GHAFFARI - ENSEA, CY Cergy Paris University, France

Ionizing radiation effects on CMOS image sensors

José Lipovetzky - Centro Atómico Bariloche – CNEA, Argentina

Analyzing the Reliability of Neural Networks in Programmable SoC Devices

Fernanda Lima Kastensmidt - UFRGS, Brazil

Radiation Test Requirements for Functional Safety Standards

Sung Chung - QRT, South Korea

Analyzing data extracted from radiation tests in advanced SRAMs

Juan A. Clemente - Universidad Complutense de Madrid, Spain

Transistor- and System-Level Approaches for Hardened-by-Design Silicon Integrated Circuits in Harsh Radiation Environments

Yann Deval - IMS, University of Bordeaux, France

Routing in Fault-Prone Delay-Tolerant Networks

Juan A. Fraire - Universidad Nacional de Córdoba, Argentina and Universität Des Saarlandes, Germany

NanosatC-Br Program and Development of Radiation Hardened Integrated Circuits for Satellites Applications

João Baptista Martins - UFSM

NanosatC-Br Program and Development of Radiation Hardened Integrated Circuits for Satellites Applications

Nelson Schuch - INPE, SM, Brazil

Radiation Effects and Mitigation Techniques in GPU

Paolo Rech - UFRGS, Brazil

Radiation Effects and Mitigation Techniques in GPU

José Rodrigo Azambuja - UFRGS, Brazil